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Optical diagnostic methods for inorganic transmissive materials : 20-21 July 1998, San Diego, California

Author: Raju Umapathi Datla; Leonard Matheus Hanssen; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE, ©1998.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 3425.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Kongress
Conference papers and proceedings
San Diego (Calif., 1998)
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Raju Umapathi Datla; Leonard Matheus Hanssen; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819428809 9780819428806
OCLC Number: 40223163
Description: vi, 270 pages : illustrations (some color) ; 28 cm.
Contents: Transmittance and reflectance (specular) chracterization of transparent materials --
Thin film coatings and filter characterization --
Spectrophotometry standards --
Methods for emittance and low-level absorptance --
Refractive index measurements --
Ellipsometry and polarimetry.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 3425.
Responsibility: Raju V. Datla, Leonard M. Hanssen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

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