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Optical diagnostics for industrial applications : 22-24 May 2000, Glasgow, Scotland, United Kingdom

Author: Neil A HalliwellSociety of Photo-optical Instrumentation Engineers.European Optical Society.Institution of Electrical Engineers.Institution of Mechanical Engineers (Great Britain)All authors
Publisher: Bellingham, Wash., USA : SPIE, ©2000.
Series: Europto series.; Proceedings of SPIE--the International Society for Optical Engineering, v. 4076.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (DLC) 2001270557
(OCoLC)45141858
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Neil A Halliwell; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Institution of Electrical Engineers.; Institution of Mechanical Engineers (Great Britain); SPIE Digital Library.
ISBN: 0819437131 9780819437136
OCLC Number: 53835156
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: ix, 302 pages : illustrations (some color) ; 28 cm.
Series Title: Europto series.; Proceedings of SPIE--the International Society for Optical Engineering, v. 4076.
Responsibility: Neil A. Halliwell, chair/editor ; sponsored by EOS--European Optical Society [and others] ; cooperating organizations, IEE--Institute of Electrical Engineers [and] IMechE--the Institution of Mechanical Engineers (UK).

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