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Optical pattern recognition XX : 16-17 April 2009, Orlando, Florida, United States

Author: D P Casasent; Tien-Hsin Chao; SPIE (Society)
Publisher: Bellingham, Wash. : SPIE, 2009.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 7340.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Optical pattern recognition XX.
Bellingham, Wash. : SPIE, 2009
(OCoLC)402467356
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: D P Casasent; Tien-Hsin Chao; SPIE (Society)
OCLC Number: 318542439
Notes: Title from PDF title page (SPIE digital library, viewed April 15, 2009).
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 7340.
Other Titles: Optical pattern recognition 20
Optical pattern recognition twenty
Responsibility: David P. Casasent, Tien-Hsin Chao, editors ; sponsored ... by SPIE.

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