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Optoelectronic materials and devices for detector, imager, display, and energy conversion technology : 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China

Author: Yadong JiangBernard KippelenJunsheng YuZhongguo guang xue xue hui.SPIE (Society)All authors
Publisher: Bellingham, WA : SPIE, ©2010.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 7658.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Symposium on Advanced Optical Manufacturing and Testing Technologies (5th : 2010 : Dalian Shi, China).
Optoelectronic materials and devices for detector, imager, display, and energy conversion technology.
Bellingham, WA : SPIE, ©2010
(OCoLC)706091060
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Yadong Jiang; Bernard Kippelen; Junsheng Yu; Zhongguo guang xue xue hui.; SPIE (Society); Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo.; China. Guo jia ke xue ji shu bu.; Zhongguo ke xue yuan.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
OCLC Number: 713705666
Language Note: English.
Notes: Sponsored by COS--Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; supporting organizations, Ministry of Science and Technology of China, Chinese Academy of Sciences (China), National Natural Science Foundation of China (China).
Description: 1 online resource (2 volumes) : illustrations.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 7658.
Other Titles: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies
International Symposium on Advanced Optical Manufacturing and Testing Technologies
Responsibility: Yadong Jiang, Bernard Kippelen, Junsheng Yu, editors.

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Primary Entity

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