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Optoelectronic measurement technology and systems : 2015 International Conference on Optical Instruments and Technology : 17-19 May 2015, Beijing, China

Author: Jigui Zhu; SPIE (Society),
Publisher: Bellingham, Washington : SPIE, [2015] ©2015
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 9623.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
(OCoLC)923105061
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jigui Zhu; SPIE (Society),
ISBN: 9781628418040 1628418044
OCLC Number: 928636454
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 9623.
Other Titles: 2015 International Conference on Optical Instruments and Technology
Responsibility: Jigui Zhu [and 4 others], editors ; sponsored by CIS--China Instrument and Control Society (China), SPIE ; published by SPIE.

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