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PAPERS - Solid-State Power and High Voltage - Experimental and Numerical Investigation on MOSFET's Failure During Reverse Recovery of Its Internal Diode
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PAPERS - Solid-State Power and High Voltage - Experimental and Numerical Investigation on MOSFET's Failure During Reverse Recovery of Its Internal Diode

Author: G Busatto; G V Persiano; F Iannuzzo
Publisher: New York, Institute of Electrical and Electronics Engineers.
Edition/Format: Article Article : English
Publication:IEEE transactions on electron devices. 46, no. 6, (1999): 1268
Database:ArticleFirst
Other Databases: British Library Serials
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Document Type: Article
All Authors / Contributors: G Busatto; G V Persiano; F Iannuzzo
ISSN:0018-9383
Language Note: English
Unique Identifier: 96023061
Awards:
Description: 6

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