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Particle characterization in technology. Volume I, Application and microanalysis

Author: John K Beddow
Publisher: Boca Raton, FL : CRC Press, 2018.
Series: Uniscience series on fine particle science and technology.; CRC revivals.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: John K Beddow
ISBN: 9781351075350 1351075357
OCLC Number: 1020790348
Description: 1 online resource.
Contents: 1. Microanalysis 2. Characterization in Various Fields of Application
Series Title: Uniscience series on fine particle science and technology.; CRC revivals.
Other Titles: Application and microanalysis
Responsibility: editor, John Keith Beddow.

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