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Particle characterization : light scattering methods

Author: Renliang Xu
Publisher: New York : Kluwer Academic, ©2002.
Series: Particle technology series (Kluwer Academic Publishers), 13.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Xu, Renliang.
Particle characterization.
New York : Kluwer Academic, ©2002
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Renliang Xu
ISBN: 0306471248 9780306471247 0792363000 9780792363002 9781280206795 1280206799 6610206791 9786610206797
OCLC Number: 50175024
Description: 1 online resource (xv, 397 pages) : illustrations.
Contents: Cover --
Table of Contents --
Preface --
Acknowledgements --
Chapter 1 PARTICLE CHARACTERIZATION --
An Overview --
1.1. Particles and Their Characterization --
1.2. A Survey of Particle Characterization Technologies --
1.3. Data Presentation and Statistics --
1.4. Sample Handling --
References --
Chapter 2 LIGHT SCATTERING --
The Background Information --
2.1. Light Scattering Phenomena and Technologies --
2.2. Light Scattering Theory --
an Outline --
2.3. Other Light Scattering Technologies --
References --
Chapter 3 LASER DIFFRACTION --
Sizing from Nanometers to Millimeters --
3.1 Introduction --
3.2. Instrumentation --
3.3. Data Acquisition and Analysis --
3.4. Accuracy of Laser Diffraction Technology --
References --
Chapter 4 OPTICAL PARTICLE COUNTING --
Counting and Sizing --
4.1. Introduction --
4.2. Instrumentation --
4.3. Data Analysis --
References --
Chapter 5 PHOTON CORRELATION SPECTROSCOPY -Submicron Particle Characterization --
5.1. Introduction --
5.2 Instrumentation --
5.3. Data Analysis --
5.4. PCS Measurement in Concentrated Suspensions --
References --
Chapter 6 ELECTROPHORETIC LIGHT SCATTERING --
Zeta Potential Measurement --
6.1. Introduction --
6.2. Zeta Potential and Electrophoretic Mobility --
6.3. Instrumentation --
6.4. Data Analysis --
6.5. Phase Analysis Light Scattering (PALS) --
References --
Appendix I: Symbols and Abbreviations --
Appendix II: ISO and ASTM Standards --
Appendix III: Instrument Manufacturers --
Appendix IV: Scattering Functions of a Sphere --
Appendix V: Scattering Factors for Randomly Oriented Particles --
Appendix VI: Physical Constants of Common Liquids --
Appendix VII: Refractive Index of Substances --
Author Index.
Series Title: Particle technology series (Kluwer Academic Publishers), 13.
Responsibility: by Renliang Xu.

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Primary Entity

<http://www.worldcat.org/oclc/50175024> # Particle characterization : light scattering methods
    a schema:MediaObject, schema:Book, schema:CreativeWork ;
    library:oclcnum "50175024" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    rdfs:comment "Warning: This malformed URI has been treated as a string - 'https://libproxy.library.unt.edu/login?url=http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=67605";'" ;
    schema:about <http://id.worldcat.org/fast/998499> ; # Light--Scattering
    schema:about <http://id.loc.gov/authorities/subjects/sh85076877> ; # Light--Scattering
    schema:about <http://experiment.worldcat.org/entity/work/data/192632667#Topic/technology_&_engineering_optics> ; # TECHNOLOGY & ENGINEERING--Optics
    schema:about <http://dewey.info/class/620.43/e22/> ;
    schema:about <http://id.worldcat.org/fast/1054114> ; # Particles--Analysis
    schema:about <http://experiment.worldcat.org/entity/work/data/192632667#Topic/particles_analysis> ; # Particles--Analysis
    schema:about <http://id.worldcat.org/fast/1054100> ; # Particle size determination
    schema:bookFormat schema:EBook ;
    schema:copyrightYear "2002" ;
    schema:creator <http://viaf.org/viaf/50451607> ; # Renliang Xu
    schema:datePublished "2002" ;
    schema:description "Cover -- Table of Contents -- Preface -- Acknowledgements -- Chapter 1 PARTICLE CHARACTERIZATION -- An Overview -- 1.1. Particles and Their Characterization -- 1.2. A Survey of Particle Characterization Technologies -- 1.3. Data Presentation and Statistics -- 1.4. Sample Handling -- References -- Chapter 2 LIGHT SCATTERING -- The Background Information -- 2.1. Light Scattering Phenomena and Technologies -- 2.2. Light Scattering Theory -- an Outline -- 2.3. Other Light Scattering Technologies -- References -- Chapter 3 LASER DIFFRACTION -- Sizing from Nanometers to Millimeters -- 3.1 Introduction -- 3.2. Instrumentation -- 3.3. Data Acquisition and Analysis -- 3.4. Accuracy of Laser Diffraction Technology -- References -- Chapter 4 OPTICAL PARTICLE COUNTING -- Counting and Sizing -- 4.1. Introduction -- 4.2. Instrumentation -- 4.3. Data Analysis -- References -- Chapter 5 PHOTON CORRELATION SPECTROSCOPY -Submicron Particle Characterization -- 5.1. Introduction -- 5.2 Instrumentation -- 5.3. Data Analysis -- 5.4. PCS Measurement in Concentrated Suspensions -- References -- Chapter 6 ELECTROPHORETIC LIGHT SCATTERING -- Zeta Potential Measurement -- 6.1. Introduction -- 6.2. Zeta Potential and Electrophoretic Mobility -- 6.3. Instrumentation -- 6.4. Data Analysis -- 6.5. Phase Analysis Light Scattering (PALS) -- References -- Appendix I: Symbols and Abbreviations -- Appendix II: ISO and ASTM Standards -- Appendix III: Instrument Manufacturers -- Appendix IV: Scattering Functions of a Sphere -- Appendix V: Scattering Factors for Randomly Oriented Particles -- Appendix VI: Physical Constants of Common Liquids -- Appendix VII: Refractive Index of Substances -- Author Index."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/192632667> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/192632667#Series/particle_technology_series_kluwer_academic_publishers> ; # Particle technology series (Kluwer Academic Publishers) ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/192632667#Series/particle_technology_series> ; # Particle technology series ;
    schema:isSimilarTo <http://worldcat.org/entity/work/data/192632667#CreativeWork/particle_characterization> ;
    schema:name "Particle characterization : light scattering methods"@en ;
    schema:productID "50175024" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/50175024#PublicationEvent/new_york_kluwer_academic_2002> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/192632667#Agent/kluwer_academic> ; # Kluwer Academic
    schema:url <http://dx.doi.org/10.1007/0-306-47124-8> ;
    schema:url <http://proxy.library.carleton.ca/login?url=http://www.myilibrary.com?id=20679> ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=67605> ;
    schema:url <http://public.ebookcentral.proquest.com/choice/publicfullrecord.aspx?p=3035578> ;
    schema:url <http://www.myilibrary.com?id=20679> ;
    schema:url <https://elib.southwest.tn.edu:3443/login?url=http://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=67605> ;
    schema:url <http://proxy.library.carleton.ca/login?url=http://www.springerlink.com/openurl.asp?genre=book&isbn=978-0-7923-6300-2> ;
    schema:url "https://libproxy.library.unt.edu/login?url=http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=67605";" ;
    schema:url <http://www.myilibrary.com?id=20679&ref=toc> ;
    schema:url <http://site.ebrary.com/id/10051575> ;
    schema:url <http://www.springerlink.com/openurl.asp?genre=book&isbn=978-0-7923-6300-2> ;
    schema:workExample <http://worldcat.org/isbn/9786610206797> ;
    schema:workExample <http://worldcat.org/isbn/9780306471247> ;
    schema:workExample <http://worldcat.org/isbn/9780792363002> ;
    schema:workExample <http://worldcat.org/isbn/9781280206795> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/50175024> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/192632667#Agent/kluwer_academic> # Kluwer Academic
    a bgn:Agent ;
    schema:name "Kluwer Academic" ;
    .

<http://experiment.worldcat.org/entity/work/data/192632667#Series/particle_technology_series> # Particle technology series ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/50175024> ; # Particle characterization : light scattering methods
    schema:name "Particle technology series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/192632667#Series/particle_technology_series_kluwer_academic_publishers> # Particle technology series (Kluwer Academic Publishers) ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/50175024> ; # Particle characterization : light scattering methods
    schema:name "Particle technology series (Kluwer Academic Publishers) ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/192632667#Topic/technology_&_engineering_optics> # TECHNOLOGY & ENGINEERING--Optics
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Optics"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85076877> # Light--Scattering
    a schema:Intangible ;
    schema:name "Light--Scattering"@en ;
    .

<http://id.worldcat.org/fast/1054100> # Particle size determination
    a schema:Intangible ;
    schema:name "Particle size determination"@en ;
    .

<http://id.worldcat.org/fast/1054114> # Particles--Analysis
    a schema:Intangible ;
    schema:name "Particles--Analysis"@en ;
    .

<http://id.worldcat.org/fast/998499> # Light--Scattering
    a schema:Intangible ;
    schema:name "Light--Scattering"@en ;
    .

<http://viaf.org/viaf/50451607> # Renliang Xu
    a schema:Person ;
    schema:familyName "Xu" ;
    schema:givenName "Renliang" ;
    schema:name "Renliang Xu" ;
    .

<http://worldcat.org/entity/work/data/192632667#CreativeWork/particle_characterization>
    a schema:CreativeWork ;
    rdfs:label "Particle characterization." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/50175024> ; # Particle characterization : light scattering methods
    .

<http://worldcat.org/isbn/9780306471247>
    a schema:ProductModel ;
    schema:isbn "0306471248" ;
    schema:isbn "9780306471247" ;
    .

<http://worldcat.org/isbn/9780792363002>
    a schema:ProductModel ;
    schema:isbn "0792363000" ;
    schema:isbn "9780792363002" ;
    .

<http://worldcat.org/isbn/9781280206795>
    a schema:ProductModel ;
    schema:isbn "1280206799" ;
    schema:isbn "9781280206795" ;
    .

<http://worldcat.org/isbn/9786610206797>
    a schema:ProductModel ;
    schema:isbn "6610206791" ;
    schema:isbn "9786610206797" ;
    .

<https://elib.southwest.tn.edu:3443/login?url=http://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=67605>
    rdfs:comment "An electronic book accessible through the World Wide Web; click for information" ;
    .


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