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Particle characterization : light scattering methods

Author: Renliang Xu
Publisher: New York : Kluwer Academic, ©2002.
Series: Particle technology series (Kluwer Academic Publishers), 13.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Xu, Renliang.
Particle characterization.
New York : Kluwer Academic, ©2002
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Renliang Xu
ISBN: 0306471248 9780306471247 0792363000 9780792363002 9781280206795 1280206799
OCLC Number: 50175024
Description: 1 online resource (xv, 397 pages) : illustrations.
Contents: Preface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.
Series Title: Particle technology series (Kluwer Academic Publishers), 13.
Responsibility: by Renliang Xu.

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