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Particles on surfaces [4] : detection, adhesion, and removal

Author: K L Mittal; Fine Particle Society. Meeting
Publisher: New York : Marcel Dekker, ©1995.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Includes the proceedings of the Fourth Symposium on Particles on Surfaces. This title includes papers that cover: adhesion-induced deformations of particles on surfaces; the use of atomic force  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: K L Mittal; Fine Particle Society. Meeting
ISBN: 0824795350 9780824795351
OCLC Number: 31974510
Notes: "Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal, held as part of the Twenty-third Annual Meeting of the Fine Particle Society, July 13-17, 1992, in San Diego, California."
Description: xii, 422 pages : illustrations ; 26 cm
Contents: Particles on surfaces - adhesion induced deformations; surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate; polymer to particle adhesion probed with atomic force microscopy; surface particle contamination identification in microelectronics; an overview of spacecraft particulate contamination phenomena; contamination on optical surfaces-concerns, prevention, detection, and removal; an advanced surface particle and molecular contaminant identification, removal, and collection system; the role of air ionization in reducing surface contamination by particles in the cleanroom; selecting a contamination-free deburring process - testing abrasive blasting media; particle generation and control in tubing and piping connection design; detection and identification of particles on silicon surfaces; the characterization of particles on spacecraft returned from orbit; a light-scattering method for determining the composition of particles on surfaces; light scattering by spherical particles on planar multi-layered substrates; new test procedure for the examination of the particulate cleanliness of technical surfaces; discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry; particle characterization on surfaces by Auger electron spectroscopy; interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves; removal of glass particles from glass surfaces - a review; particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement; fluid dynamics of liquid jets used for particle removal from surfaces; enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions; laser cleaning techniques for the removal of small surface particulates.
Other Titles: Particles on surfaces four
Responsibility: edited by K.L. Mittal.

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