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Phénomènes critiques, systèmes aléatoires, théories de jauge = Critical phenomena, random systems, gauge theories
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Phénomènes critiques, systèmes aléatoires, théories de jauge = Critical phenomena, random systems, gauge theories

Author: K Osterwalder; Raymond Stora; David Brydges; et al
Publisher: Amsterdam ; New York : North-Holland ; New York, N.Y. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
Edition/Format:   Book : Conference publication : EnglishView all editions and formats
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Genre/Form: Congresses
Congrès
Additional Physical Format: Online version:
Ecole d'été de physique théorique (Les Houches, Haute-Savoie, France) (43rd : 1984)
Phénomènes critiques, systèmes aléatoires, théories de jauge.
Amsterdam ; New York : North-Holland ; New York, N.Y. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986
(OCoLC)610127194
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: K Osterwalder; Raymond Stora; David Brydges; et al
ISBN: 0444869808 9780444869807 0444870067 9780444870063 0444870075 9780444870070
OCLC Number: 13642610
Notes: English and French.
At head of title: USMG, NATO ASI. Les Houches, session XLIII, 1 août-7 septembre 1984.
Lectures delivered at the Les Houches Summer School of Theoretical Physics.
Description: 2 v. (xxxvii, 1199 p., [1] leaf of plates) : ill. ; 23 cm.
Other Titles: Critical phenomena, random systems, gauge theories.
Responsibility: édité par Konrad Osterwalder et Raymond Stora ; conférenciers, David Brydges ... [et al.].

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