skip to content
Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA Preview this item
ClosePreview this item
Checking...

Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA

Author: Dennis H Goldstein; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
Publisher: Bellingham, Wash. : SPIE, ©2002.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4481.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (DLC) 2002277725
(OCoLC)49209180
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dennis H Goldstein; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
ISBN: 0819441953 9780819441959
OCLC Number: 53837166
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: ix, 324 pages : illustrations, map ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4481.
Responsibility: Dennis H. Goldstein [and others], chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/53837166> # Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA
    a schema:CreativeWork, schema:Book, schema:MediaObject ;
    library:oclcnum "53837166" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/378581726#Place/bellingham_wash> ; # Bellingham, Wash.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
    schema:about <http://id.worldcat.org/fast/1068274> ; # Polarimetry
    schema:about <http://experiment.worldcat.org/entity/work/data/378581726#Topic/electrooptics> ; # Electrooptics
    schema:about <http://experiment.worldcat.org/entity/work/data/378581726#Topic/polarimetry> ; # Polarimetry
    schema:about <http://experiment.worldcat.org/entity/work/data/378581726#Topic/remote_sensing> ; # Remote sensing
    schema:about <http://id.worldcat.org/fast/1094469> ; # Remote sensing
    schema:about <http://id.worldcat.org/fast/907678> ; # Electrooptics
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/151856603> ; # Society of Photo-optical Instrumentation Engineers.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/378581726#Organization/spie_digital_library> ; # SPIE Digital Library.
    schema:contributor <http://viaf.org/viaf/44539411> ; # Dennis H. Goldstein
    schema:copyrightYear "2002" ;
    schema:datePublished "2002" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/378581726> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/378581726#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
    schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # SPIE proceedings series,
    schema:isSimilarTo <http://www.worldcat.org/oclc/49209180> ;
    schema:name "Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA"@en ;
    schema:productID "53837166" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/53837166#PublicationEvent/bellingham_wash_spie_2002> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/378581726#Agent/spie> ; # SPIE
    schema:url <http://proxy.library.carleton.ca/login?url=http://link.spie.org/PSISDG/4481/1> ;
    schema:url <http://proceedings.spiedigitallibrary.org/volume.aspx?volume=4481> ;
    schema:url <http://link.spie.org/PSISDG/4481/1> ;
    schema:workExample <http://worldcat.org/isbn/9780819441959> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/53837166> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/378581726#Organization/spie_digital_library> # SPIE Digital Library.
    a schema:Organization ;
    schema:name "SPIE Digital Library." ;
    .

<http://experiment.worldcat.org/entity/work/data/378581726#Place/bellingham_wash> # Bellingham, Wash.
    a schema:Place ;
    schema:name "Bellingham, Wash." ;
    .

<http://experiment.worldcat.org/entity/work/data/378581726#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/53837166> ; # Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA
    schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://id.worldcat.org/fast/1068274> # Polarimetry
    a schema:Intangible ;
    schema:name "Polarimetry"@en ;
    .

<http://id.worldcat.org/fast/1094469> # Remote sensing
    a schema:Intangible ;
    schema:name "Remote sensing"@en ;
    .

<http://id.worldcat.org/fast/907678> # Electrooptics
    a schema:Intangible ;
    schema:name "Electrooptics"@en ;
    .

<http://viaf.org/viaf/151856603> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
    schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/44539411> # Dennis H. Goldstein
    a schema:Person ;
    schema:familyName "Goldstein" ;
    schema:givenName "Dennis H." ;
    schema:name "Dennis H. Goldstein" ;
    .

<http://worldcat.org/isbn/9780819441959>
    a schema:ProductModel ;
    schema:isbn "0819441953" ;
    schema:isbn "9780819441959" ;
    .

<http://worldcat.org/issn/0277-786X> # SPIE proceedings series,
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/53837166> ; # Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA
    schema:issn "0277-786X" ;
    schema:name "SPIE proceedings series," ;
    .

<http://www.worldcat.org/oclc/49209180>
    a schema:CreativeWork ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/53837166> ; # Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA
    .

<http://www.worldcat.org/title/-/oclc/53837166>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/53837166> ; # Polarization analysis, measurement, and remote sensing IV : 29-31 July, 2001, San Diego, USA
    schema:dateModified "2018-07-17" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.