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Practice for Air Force placement tests : to get ahead in the Air Force

Author: David R Turner
Publisher: New York : Arco, ©1977.
Edition/Format:   Print book : English : 4th edView all editions and formats
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Genre/Form: Examinations
Document Type: Book
All Authors / Contributors: David R Turner
ISBN: 0668042621 9780668042628 0668042702 9780668042703
OCLC Number: 2818245
Description: 192 pages : illustrations ; 26 cm
Other Titles: Air Force placement tests
Responsibility: by David R. Turner.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/2818245> # Practice for Air Force placement tests : to get ahead in the Air Force
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "2818245" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   schema:about <http://id.worldcat.org/fast/814645> ; # Armed Services Vocational Aptitude Battery
   schema:about <http://dewey.info/class/358.40076/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1806156837#Organization/united_states_air_force> ; # United States. Air Force.
   schema:about <http://viaf.org/viaf/142489267> ; # United States. Air Force
   schema:alternateName "Air Force placement tests" ;
   schema:bookEdition "4th ed." ;
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "1977" ;
   schema:creator <http://viaf.org/viaf/28341336> ; # David Reuben Turner
   schema:datePublished "1977" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1806156837> ;
   schema:genre "Examinations"@en ;
   schema:inLanguage "en" ;
   schema:name "Practice for Air Force placement tests : to get ahead in the Air Force"@en ;
   schema:productID "2818245" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/2818245#PublicationEvent/new_york_arco_1977> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1806156837#Agent/arco> ; # Arco
   schema:workExample <http://worldcat.org/isbn/9780668042628> ;
   schema:workExample <http://worldcat.org/isbn/9780668042703> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/2818245> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/1806156837#Organization/united_states_air_force> # United States. Air Force.
    a schema:Organization ;
   schema:name "United States. Air Force." ;
    .

<http://id.worldcat.org/fast/814645> # Armed Services Vocational Aptitude Battery
    a schema:Intangible ;
   schema:name "Armed Services Vocational Aptitude Battery"@en ;
    .

<http://viaf.org/viaf/142489267> # United States. Air Force
    a schema:Organization ;
   schema:name "United States. Air Force" ;
    .

<http://viaf.org/viaf/28341336> # David Reuben Turner
    a schema:Person ;
   schema:birthDate "1915" ;
   schema:deathDate "2006" ;
   schema:familyName "Turner" ;
   schema:givenName "David Reuben" ;
   schema:givenName "David R." ;
   schema:name "David Reuben Turner" ;
    .

<http://worldcat.org/isbn/9780668042628>
    a schema:ProductModel ;
   schema:isbn "0668042621" ;
   schema:isbn "9780668042628" ;
    .

<http://worldcat.org/isbn/9780668042703>
    a schema:ProductModel ;
   schema:isbn "0668042702" ;
   schema:isbn "9780668042703" ;
    .


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