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Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico

Author: IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1999.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
ISBN: 076950325X 9780769503257 0769503276 9780769503271
OCLC Number: 42962923
Notes: "IEEE Computer Society Press Order Number PR00325"--Title page verso.
Description: xiii, 405 pages : illustrations ; 23 cm
Other Titles: Defect and Fault Tolerance in VLSI Systems, 1999, DFT '99, International Symposium on.
1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Defect and fault tolerance in VLSI systems
DFT'99
Responsibility: sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council.

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