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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/42962923 Title: Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1999. ISBN/ISSN: 076950325X 9780769503257 0769503276 9780769503271 OCLC:42962923

  
  

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Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico

Author:	IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher:	Los Alamitos, Calif. : IEEE Computer Society Press, ©1999.
Edition/Format:	Print book : Conference publication : EnglishView all editions and formats
Summary:	These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.  Read more...
Rating:	(not yet rated) 0 with reviews - Be the first.
Subjects	Integrated circuits -- Very large scale integration -- Design and construction -- Congresses. Fault-tolerant computing -- Congresses. Fault-tolerant computing. View all subjects
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