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Genre/Form: | Conference papers and proceedings Congresses |
---|---|
Material Type: | Conference publication, Internet resource |
Document Type: | Book, Internet Resource |
All Authors / Contributors: | IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee. |
ISBN: | 076950325X 9780769503257 0769503276 9780769503271 |
OCLC Number: | 42962923 |
Notes: | "IEEE Computer Society Press Order Number PR00325"--Title page verso. |
Description: | xiii, 405 pages : illustrations ; 23 cm |
Other Titles: | Defect and Fault Tolerance in VLSI Systems, 1999, DFT '99, International Symposium on. 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems DFT'99 |
Responsibility: | sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council. |
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