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Proceedings : 2009 Asian Test Symposium : ATS 2009 : 23-26 November, 2009, Taichung, Taiwan

Author: IEEE Computer Society. Technical Council on Test Technology.
Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2009.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Additional Physical Format: Print version:
Asian Test Symposium (18th : 2009 : Taichung, Taiwan).
Proceedings.
Los Alamitos, Calif. : IEEE Computer Society, ©2009
(OCoLC)547364471
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Technical Council on Test Technology.
OCLC Number: 645300090
Description: 1 online resource (xxv, 465 pages) : illustrations
Other Titles: 18th Asian Test Symposium
Asian Test Symposium
ATS 2009
Asian Test Symposium, 2009. ATS '09
ATS '09
Responsibility: [sponsored by IEEE Computer Society Test Technology Council].

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