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Proceedings, 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems : DDECS 2015 : 22-24 April 2015, Belgrade, Serbia

Author: Zoran Stamenkovic; IEEE Computer Society,; IEEE Computer Society. Technical Council on Test Technology,; Institute of Electrical and Electronics Engineers.
Publisher: Los Alamitos, California : Conference Publishing Services, IEEE Computer Society, [2015] ©2015
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
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A forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic and nanoelectronic circuits and systems.

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Zoran Stamenkovic; IEEE Computer Society,; IEEE Computer Society. Technical Council on Test Technology,; Institute of Electrical and Electronics Engineers.
OCLC Number: 922381085
Notes: "IEEE Computer Society Order Number E5519"--PDF copyright page.
Description: 1 online resource (xviii, 308 pages) : illustrations (some color)
Other Titles: 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
DDECS 2015
IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
Responsibility: edited by Zoran Stamenkovic [and 3 others].

Abstract:

Annotation

A forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic and nanoelectronic circuits and systems.

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