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Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2004

Author: Steve S Chung; IEEE Electron Devices Society. Taipei Chapter.; IEEE Electron Devices Society.; IEEE Reliability/CPMT/ED Singapore Chapter.
Publisher: Piscataway, N.J. : IEEE, ©2004.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th : 2004 : Taipei, Taiwan).
Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits.
Piscataway, N.J. : IEEE, ©2004
(DLC) 2004103511
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Steve S Chung; IEEE Electron Devices Society. Taipei Chapter.; IEEE Electron Devices Society.; IEEE Reliability/CPMT/ED Singapore Chapter.
ISBN: 0780384547 9780780384545
OCLC Number: 56836580
Notes: Conference held on July 5-8, 2004, in Taiwan.
"IEEE Catalog Number 04TH8743"--Title page verso.
Description: 1 online resource ([xi, 329] pages) : illustrations
Other Titles: Physical and Failure Analysis of Integrated Circuits, 2004, IPFA 2004, Proceedings of the 11th International Symposium on.
IPFA 2004
Physical & failure analysis of integrated circuits
Responsibility: edited by Steve S. Chung [and others] ; organised by IEEE ED Taipei Chapter, IEEE Taipei Section, National Chiao Tung University ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society, National Science Council, Taiwan ; in co-operation with IEEE Reliability/CPMT/ED Singapoer Chapter.

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