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Proceedings of the 16th International Conference on Defects in Semiconductors : ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991

Author: Gordon Davies; Gary Gerard DeLeo; Michael Stavola
Publisher: Zürich, Switzerland ; Brookfield, VT, USA : Trans Tech Publications, ©1992.
Series: Materials science forum, v. 83-87.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
International Conference on Defects in Semiconductors (16th : 1991 : Bethlehem, Pa.)
Proceedings of the 16th International Conference on Defects in Semiconductors.
Zürich, Switzerland ; Brookfield, VT, USA : Trans Tech Publications, ©1992
(OCoLC)988327268
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Gordon Davies; Gary Gerard DeLeo; Michael Stavola
ISBN: 0878496289 9780878496280
OCLC Number: 25330567
Notes: Cover title: Defects in semiconductors 16.
Description: 3 volumes (1604 pages) : illustrations ; 25 cm.
Series Title: Materials science forum, v. 83-87.
Other Titles: ICDS 16
Defects in semiconductors 16
Responsibility: edited by Gordon Davies, Gary G. DeLeo, and Michael Stavola.

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