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Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Author: P Rai-Choudhury; Electrochemical Society. Electronics Division.
Publisher: Pennington, NJ : Electrochemical Society, ©1997.
Series: Proceedings (Electrochemical Society), v. 97-12.; Proceedings of SPIE--the International Society for Optical Engineering, v. 3322.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Kongress
Conference papers and proceedings
Montréal (1997)
Congresses
Additional Physical Format: Online version:
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1997 : Montréal, Québec).
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.
Pennington, NJ : Electrochemical Society, ©1997
(OCoLC)645884394
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: P Rai-Choudhury; Electrochemical Society. Electronics Division.
ISBN: 1566771390 9781566771399
OCLC Number: 38188454
Notes: "Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."
Description: ix, 478 pages : illustrations ; 23 cm.
Series Title: Proceedings (Electrochemical Society), v. 97-12.; Proceedings of SPIE--the International Society for Optical Engineering, v. 3322.
Other Titles: Diagnostic techniques for semiconductor materials and devices
Responsibility: editors, P. Rai-Choudhury [and others].

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