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Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Author: Thomas J Shaffner; Dieter K Schroder; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectrics and Insulation Division.
Publisher: Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, ©1988.
Series: Proceedings (Electrochemical Society), v. 88-20.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Thomas J Shaffner; Dieter K Schroder; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectrics and Insulation Division.
OCLC Number: 19282155
Notes: Sponsored by the Electronics and Dielectrics and Insulation Divisions.
Description: vi, 289 pages : illustrations ; 23 cm.
Series Title: Proceedings (Electrochemical Society), v. 88-20.
Responsibility: edited by Thomas J. Shaffner, Dieter K. Schroder.

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