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Proceedings, the first IEEE International Workshop on Electronic Design, Test and Applications : [DELTA]'2002, 29-31 January 2002, Christchurch, New Zealand

Author: M RenovellIEEE Computer Society. Technical Council on Test Technology.Massey University.Institution of Electrical Engineers.Institution of Professional Engineers New Zealand.All authors
Publisher: Los Alamitos, California : IEEE Computer Society, ©2002.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

This volume originates from the 2002 International Workshop on Electronic Design, Test and Applications examines computer hardware design and testing, and is aimed at researchers, professors,  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: M Renovell; IEEE Computer Society. Technical Council on Test Technology.; Massey University.; Institution of Electrical Engineers.; Institution of Professional Engineers New Zealand.; MOSIS (Firm)
ISBN: 0769514537 0769514553 9780769514536 9780769514550
OCLC Number: 268932099
Notes: "IEEE Computer Society Order Number PR01453"--Title page verso.
The delta in the title is a triangle comprised of three interlocking 60 degree angles, one inscribed "design", one "testing" and one "applications."
Description: xvii, 517 pages : illustrations ; 28 cm
Other Titles: International Workshop on Electronic Design, Test and Applications
Electronic Design, Test and Applications '2002
DELTA'2002
First IEEE International Workshop on Electronic Design, Test and Applications
Responsibility: edited by M. Renovell [and others] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Massey University, New Zealand ; in cooperation with MOSIS [and others] ; with assistance from IEE--Institution on Electrical Engineers, IPENZ--Institute of Professional Engineers of New Zealand.

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