skip to content
Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings Preview this item
ClosePreview this item
Checking...

Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings

Author: IEEE Computer Society. Technical Council on Test Technology.
Publisher: Los Alamitos, Calif. : Conference Pub. Services : IEEE Computer Society, ©2008.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Additional Physical Format: Print version:
IEEE European Test Symposium (13th : 2008 : Verbania, Italy).
Proceedings.
Los Alamitos, Calif. : Conference Pub. Services : IEEE Computer Society, ©2008
(DLC) 2009286019
(OCoLC)421151263
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Technical Council on Test Technology.
OCLC Number: 240824212
Notes: "IEEE Computer Society Order Number P3150"--Title page verso.
Description: 1 online resource (xvii, 205 pages) : illustrations
Other Titles: Thirteenth IEEE European Test Symposium
ETS 2008
13th IEEE European Test Symposium
Proceedings of the 13th IEEE European Test Symposium
European Test, 2008 13th
European Test Symposium
Responsibility: [sponsored by TTTC].

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/240824212> # Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings
    a schema:CreativeWork, schema:Book, schema:MediaObject ;
    library:oclcnum "240824212" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/141272000#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/141272000#Topic/integrated_circuits_testing> ; # Integrated circuits--Testing
    schema:about <http://id.worldcat.org/fast/975593> ; # Integrated circuits--Testing
    schema:about <http://dewey.info/class/621.3815/> ;
    schema:alternateName "Proceedings of the 13th IEEE European Test Symposium" ;
    schema:alternateName "European Test, 2008 13th" ;
    schema:alternateName "ETS 2008" ;
    schema:alternateName "13th IEEE European Test Symposium" ;
    schema:alternateName "European Test Symposium" ;
    schema:alternateName "Thirteenth IEEE European Test Symposium" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/127803337> ; # IEEE Computer Society. Technical Council on Test Technology.
    schema:copyrightYear "2008" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/141272000#Meeting/ieee_european_test_symposium_13th_2008_verbania_italy> ; # IEEE European Test Symposium (13th : 2008 : Verbania, Italy)
    schema:datePublished "2008" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/141272000> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Electronic books"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/421151263> ;
    schema:name "Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings"@en ;
    schema:productID "240824212" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/240824212#PublicationEvent/los_alamitos_calif_conference_pub_services_ieee_computer_society_2008> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/141272000#Agent/conference_pub_services> ; # Conference Pub. Services
    schema:publisher <http://experiment.worldcat.org/entity/work/data/141272000#Agent/ieee_computer_society> ; # IEEE Computer Society
    schema:url <http://ezproxy.uis.edu:2048/login?url=http://ieeexplore.ieee.org/servlet/opac?punumber=4556006> ;
    schema:url <https://ieeexplore.ieee.org/servlet/opac?punumber=4556006> ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=4556006> ;
    schema:url <https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=4556006> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/240824212> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/141272000#Agent/conference_pub_services> # Conference Pub. Services
    a bgn:Agent ;
    schema:name "Conference Pub. Services" ;
    .

<http://experiment.worldcat.org/entity/work/data/141272000#Agent/ieee_computer_society> # IEEE Computer Society
    a bgn:Agent ;
    schema:name "IEEE Computer Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/141272000#Meeting/ieee_european_test_symposium_13th_2008_verbania_italy> # IEEE European Test Symposium (13th : 2008 : Verbania, Italy)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/141272000#Place/verbania_italy> ; # Verbania, Italy)
    schema:name "IEEE European Test Symposium (13th : 2008 : Verbania, Italy)" ;
    .

<http://experiment.worldcat.org/entity/work/data/141272000#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
    schema:name "Los Alamitos, Calif." ;
    .

<http://experiment.worldcat.org/entity/work/data/141272000#Place/verbania_italy> # Verbania, Italy)
    a schema:Place ;
    schema:name "Verbania, Italy)" ;
    .

<http://id.worldcat.org/fast/975593> # Integrated circuits--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Testing"@en ;
    .

<http://viaf.org/viaf/127803337> # IEEE Computer Society. Technical Council on Test Technology.
    a schema:Organization ;
    schema:name "IEEE Computer Society. Technical Council on Test Technology." ;
    .

<http://www.worldcat.org/oclc/421151263>
    a schema:CreativeWork ;
    rdfs:label "Proceedings." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/240824212> ; # Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings
    .

<http://www.worldcat.org/title/-/oclc/240824212>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/240824212> ; # Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings
    schema:dateModified "2018-07-13" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<https://ieeexplore.ieee.org/servlet/opac?punumber=4556006>
    rdfs:comment "E-book - Full text from IEEE Xplore (Please do not use Internet Explorer) (available on site only; if working off-site please use MetCat)" ;
    .

<https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=4556006>
    rdfs:comment "IEEE Xplore (Access restricted to 50 simultaneous users)" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.