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Genre/Form: Congresses
Additional Physical Format: European Design and Test Conference.
Proceedings of the ... European conference on Design and Test
(OCoLC)56719663
Online version:
European Design and Test Conference.
Proceedings
(OCoLC)706003677
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File, Journal / Magazine / Newspaper
All Authors / Contributors: EDA Association.; ACM Digital Library.; IEEE Xplore (Online service)
OCLC Number: 61677488
Description: volumes : illustrations ; 28 cm
Responsibility: the European Design and Test Conference.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/61677488> # Proceedings
    a schema:CreativeWork, schema:Periodical, schema:MediaObject ;
    library:oclcnum "61677488" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/33411957#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
    schema:about <http://experiment.worldcat.org/entity/work/data/33411957#Topic/electronic_circuit_design_data_processing> ; # Electronic circuit design--Data processing
    schema:about <http://dewey.info/class/621.3815/e20/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/33411957#Topic/application_specific_integrated_circuits_testing_data_processing> ; # Application-specific integrated circuits--Testing--Data processing
    schema:about <http://id.worldcat.org/fast/811722> ; # Application-specific integrated circuits--Design--Data processing
    schema:about <http://id.worldcat.org/fast/906866> ; # Electronic circuit design--Data processing
    schema:about <http://experiment.worldcat.org/entity/work/data/33411957#Topic/application_specific_integrated_circuits_design_data_processing> ; # Application-specific integrated circuits--Design--Data processing
    schema:contributor <http://experiment.worldcat.org/entity/work/data/33411957#Meeting/euro_asic_conference> ; # Euro ASIC (Conference)
    schema:contributor <http://viaf.org/viaf/139825222> ; # IEEE Xplore (Online service)
    schema:contributor <http://viaf.org/viaf/155091561> ; # ACM Digital Library.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_conference_on_design_automation> ; # European Conference on Design Automation.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_test_conference> ; # European Test Conference.
    schema:contributor <http://viaf.org/viaf/123985119> ; # EDA Association.
    schema:copyrightYear "1994/" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_design_and_test_conference> ; # European Design and Test Conference.
    schema:datePublished "1994/9999" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/33411957> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/56719663> ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/706003677> ;
    schema:name "Proceedings"@en ;
    schema:productID "61677488" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/61677488#PublicationEvent/los_alamitos_calif_ieee_computer_society_press_1994> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/33411957#Agent/ieee_computer_society_press> ; # IEEE Computer Society Press
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=4452> ;
    schema:url <http://books.google.com/books?id=jpxVAAAAMAAJ> ;
    schema:url <http://portal.acm.org/browse_dl.cfm?linked=1&part=series&idx=SERIES10809&coll=portal&dl=ACM&CFID=29011489&CFTOKEN=88604797> ;
    schema:url <http://books.google.com/books?id=fJNVAAAAMAAJ> ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=3563> ;
    schema:url <http://ezproxy.rice.edu/login?url=http://dl.acm.org/event.cfm?id=RE344&tab=pubs&CFID=680270856&CFTOKEN=66716499> ;
    schema:url <http://books.google.com/books?id=3pxVAAAAMAAJ> ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=3300> ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=946> ;
    schema:url <http://books.google.com/books?id=PZ5VAAAAMAAJ> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/61677488> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/33411957#Agent/ieee_computer_society_press> # IEEE Computer Society Press
    a bgn:Agent ;
    schema:name "IEEE Computer Society Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Meeting/euro_asic_conference> # Euro ASIC (Conference)
    a bgn:Meeting, schema:Event ;
    schema:name "Euro ASIC (Conference)" ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_conference_on_design_automation> # European Conference on Design Automation.
    a bgn:Meeting, schema:Event ;
    schema:name "European Conference on Design Automation." ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_design_and_test_conference> # European Design and Test Conference.
    a bgn:Meeting, schema:Event ;
    schema:name "European Design and Test Conference." ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Meeting/european_test_conference> # European Test Conference.
    a bgn:Meeting, schema:Event ;
    schema:name "European Test Conference." ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
    schema:name "Los Alamitos, Calif." ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Topic/application_specific_integrated_circuits_design_data_processing> # Application-specific integrated circuits--Design--Data processing
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh89004045> ;
    schema:name "Application-specific integrated circuits--Design--Data processing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Topic/application_specific_integrated_circuits_testing_data_processing> # Application-specific integrated circuits--Testing--Data processing
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh89004045> ;
    schema:name "Application-specific integrated circuits--Testing--Data processing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/33411957#Topic/electronic_circuit_design_data_processing> # Electronic circuit design--Data processing
    a schema:Intangible ;
    rdfs:seeAlso <http://id.loc.gov/authorities/subjects/sh2008102924> ;
    schema:name "Electronic circuit design--Data processing"@en ;
    .

<http://id.worldcat.org/fast/811722> # Application-specific integrated circuits--Design--Data processing
    a schema:Intangible ;
    schema:name "Application-specific integrated circuits--Design--Data processing"@en ;
    .

<http://id.worldcat.org/fast/906866> # Electronic circuit design--Data processing
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85042278> ;
    schema:name "Electronic circuit design--Data processing"@en ;
    .

<http://ieeexplore.ieee.org/servlet/opac?punumber=3300>
    rdfs:comment "Full text available from IEEE Electronic Library Online: from 1995 to 1995" ;
    .

<http://ieeexplore.ieee.org/servlet/opac?punumber=3563>
    rdfs:comment "Full text available from IEEE Electronic Library Online: from 1996 to 1996" ;
    .

<http://ieeexplore.ieee.org/servlet/opac?punumber=4452>
    rdfs:comment "Full text available from IEEE Electronic Library Online: from 1997 to 1997" ;
    .

<http://ieeexplore.ieee.org/servlet/opac?punumber=946>
    rdfs:comment "Full text available from IEEE Electronic Library Online: from 1994 to 1994" ;
    .

<http://viaf.org/viaf/123985119> # EDA Association.
    a schema:Organization ;
    schema:name "EDA Association." ;
    .

<http://viaf.org/viaf/139825222> # IEEE Xplore (Online service)
    a schema:Organization ;
    schema:name "IEEE Xplore (Online service)" ;
    .

<http://viaf.org/viaf/155091561> # ACM Digital Library.
    a schema:Organization ;
    schema:name "ACM Digital Library." ;
    .

<http://www.worldcat.org/oclc/56719663>
    a schema:CreativeWork ;
    rdfs:label "Proceedings of the ... European conference on Design and Test" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/61677488> ; # Proceedings
    .

<http://www.worldcat.org/oclc/706003677>
    a schema:CreativeWork ;
    rdfs:label "Proceedings" ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/61677488> ; # Proceedings
    .


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