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Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)

Author: J Lally; R Meister; Catholic University of America. Department of Electrical Engineering,; United States. National Aeronautics and Space Administration,
Publisher: [Washington, D.C.] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1993.
Series: NASA contractor report, NASA-CR-175156.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
Summary:
Attenuators; beam splitters; carbon dioxide lasers; dielectric properties; Mach-Zehnder interferometers; reflectance; submillimeter waves.

This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters.

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Additional Physical Format: Onlien version:
Lally, J.
Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)
(OCoLC)890408997
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: J Lally; R Meister; Catholic University of America. Department of Electrical Engineering,; United States. National Aeronautics and Space Administration,
OCLC Number: 793520447
Notes: "11 July 1983."
Description: 1 microfiche (16, [3] pages) : negative, illustrations ; 11 x 15 cm.
Series Title: NASA contractor report, NASA-CR-175156.
Other Titles: Instrumemtation and measurement of index of refraction
Responsibility: principal investigators: J. Lally and R. Meister.

Abstract:

Attenuators; beam splitters; carbon dioxide lasers; dielectric properties; Mach-Zehnder interferometers; reflectance; submillimeter waves.

This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters.

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