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Psychological testing : principles, applications, and issues

Autor Robert M Kaplan; Dennis P Saccuzzo
Vydavatel: Belmont, CA : Wadsworth Cengage Learning, ©2009.
Vydání/formát:   book_printbook : English : 7th edZobrazit všechny vydání a formáty
Databáze:WorldCat
Shrnutí:
"Psychological Testing: Principles, Applications, and Issues, Seventh Edition is organized into three parts. Part I focuses on the core concepts that affect the evaluation of all tests. Part II discusses the major types of psychological tests, while Part III looks at present-day issues affecting testing such as bias, laws and ethics. The text features a multitude of test profiles and sample items, demonstrating how  Přečíst více...
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Detaily

Typ materiálu: Internetový zdroj
Typ dokumentu: Book, Internet Resource
Všichni autoři/tvůrci: Robert M Kaplan; Dennis P Saccuzzo
ISBN: 9780495095552 0495095559 0495506354 9780495506355
OCLC číslo: 191810258
Popis: xxvi, 715 p. : ill. ; 24 cm.
Obsahy: Norms and basic statistics for testing --
Correlation and regression --
Reliability --
Validity --
Writing and evaluating test items --
Test administration --
Interviewing techniques --
Theories of intelligence and the Binet scales --
The Wechsler Intelligence Scales : WAIS-III, WISC-IV, and WPPSI-III --
Other individual tests of ability in education and special education --
Standardized tests in education, civil service, and the military --
Applications in clinical and counseling settings --
Projective personality tests --
Computers and basic psychological science in testing --
Testing in counseling psychology --
Testing in health psychology and health care --
Testing in industrial and business settings --
Test bias --
Testing and the law --
Ethics and the future of psychological testing.
Odpovědnost: Robert M. Kaplan, Dennis P. Saccuzzo.
Více informací:

Anotace:

PSYCHOLOGICAL TESTING: PRINCIPLES, APPLICATIONS, AND ISSUES, SEVENTH EDITION discusses the fundamentals of psychological testing, in addition to examining test applications and present-day testing  Přečíst více...

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