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Psychometrics

Author: C Radhakrishna Rao; S Sinharay
Publisher: Amsterdam ; Boston : Elsevier, 2007.
Series: Handbook of statistics (Amsterdam, Netherlands), v. 26.
Edition/Format:   Print book : English : 1st edView all editions and formats
Database:WorldCat
Summary:

Presents an exposition of theoretical, methodological and applied issues in Psychometrics. This book includes real, often complicated, data examples to demonstrate the applications of the statistical  Read more...

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Genre/Form: Aufsatzsammlung
Lehrbuch
Handbooks and manuals
Handbooks, manuals, etc
Guides, manuels, etc
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: C Radhakrishna Rao; S Sinharay
ISBN: 9780444521033 0444521038
OCLC Number: 70775783
Description: xx, 1169 pages : illustrations ; 25 cm.
Contents: A history and overview of psychometrics / Lyle V. Jones and David Thissen --
Selected topics in classical test theory / Charles Lewis --
Validity : foundational issues and statistical methodology / Bruno D. Zumbo --
Reliability coefficients and generalizability theory / Noreen M. Webb, Richard J. Shavelson and Edward H. Haertel --
Differential item functioning and item bias / Randall D. Penfield and Gregory Camilli --
Equating test scores / Paul W. Holland, Neil J. Dorans and Nancy S. Petersen --
Electronic essay grading / Shelby J. Haberman --
Some matrix results useful in psychometric research / C. Radhakrishna Rao --
Factor analysis / Haruo Yanai and Masanori Ichikawa --
Structural equation modeling / Ke-Hai Yuan and Peter M. Bentler --
Applications of multidemensional scaling in psychometrics / Yoshio Takane --
Multilevel models in psychometrics / Fiona Steele and Harvey Goldstein --
Latent class analysis in psychometrics / C. Mitchell Dayton and George B. Macready --
Random-effects models for preference data / Ulf Böckenholt and Rung-Ching Tsai --
Item response theory in a general framework / R. Darrell Bock and Irini Moustaki --
Rasch models / Gerhard H. Fischer --
Hierarchical item response theory models / Matthew S. Johnson, Sandip Sinharay and Eric T. Bradlow --
Multidimensional item response theory / Mark D. Reckase --
Mixture distribution item response models / Matthias von Davier and Jürgen Rost --
Scoring open ended questions / Gunter Maris and Timo Bechger --
Assessing the fit of item response theory models / Hariharan Swaminathan, Ronald K. Hambleton and H. Jane Rogers --
Nonparametric item response theory and special topics / Klaas Sijtsma and Rob R. Meijer --
Automatic item generation and cognitive psychology / Susan Embretson and Xiangdong Yang --
Statistical inference for causal effects, with emphasis on applications in psychometrics and education / Donald B. Rubin --
Statistical aspects of adaptive testing / Wim J. van der Linden and Cees A.W. Glas --
Bayesian psychometric modeling from an evidence-centered design perspective / Robert J. Mislevy and Roy Levy --
Value-added modeling / Henry Braun and Howard Wainer --
Three statistical paradoxes in the interpretation of group differences : illustrated with medical school admission and licensing data / Howard Wainer and Lisa M. Brown --
Meta-analysis / Larry V. Hedges --
Vertical scaling : statistical models for measuring growth and achievement / Richard J. Patz and Lihua Yao --
Review of cognitively diagnostic assessment and a summary of psychometric models / Louis V. DiBello, Louis A. Roussos and William Stout --
Some notes on models for cognitively based skills diagnosis / Shelby J. Haberman and Matthias von Davier --
The statistical procedures used in national assessment of educational progress : recent developments and future directions / Matthias von Davier [and others] --
Statistical procedures used in college admissions testing / Jinghua Liu, Deborah J. Harris and Amy Schmidt --
Integration of models / Robert L. Brennan --
Linking scores across computer and paper-based modes of test administration / Daniel R. Eignor --
Linking cognitively-based models and psychometric methods / Mark J. Gierl and Jacqueline P. Leighton --
Technical considerations in equating complex assessments / Ida Lawrence --
Future challenges to psychometrics : validity, validity, validity / Neal Kingston --
Testing with and without computers / Piet Sanders --
Practical challenges to psychometrics driven by increased visibility of assessment / Cynthia Board Schmeiser.
Series Title: Handbook of statistics (Amsterdam, Netherlands), v. 26.
Responsibility: edited by C.R. Rao, S. Sinharay.
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