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Quantitative evaluation of surveillance test intervals including test-caused risks

Author: I S Kim; U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Systems Research.; Brookhaven National Laboratory.
Publisher: Washington, DC : Division of Systems Research, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission : Supt. of Docs., U.S. G.P.O. [distributor], 1992.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: I S Kim; U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Systems Research.; Brookhaven National Laboratory.
ISBN: 0160365783 9780160365782
OCLC Number: 27081839
Notes: "Brookhaven National Laboratory."
Distributed to depository libraries in microfiche.
Shipping list no.: 92-1900-M.
"Date published: February 1992."
"NUREG/CR-5775."
"BNL-NUREG-52296."
Reproduction Notes: Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992]. 1 microfiche : negative.
Description: 1 volume (various pagings) : illustrations ; 28 cm
Responsibility: prepared by I.S. Kim [and others].

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