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Quantitative infrared spectroscopy for understanding of a condensed matter

Author: Takeshi Hasegawa
Publisher: Tokyo, Japan : Springer, 2017.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book is intended to provide a course of infrared spectroscopy for quantitative analysis, covering both bulk matter and surface/interface analyses. Although the technology of Fourier transform infrared (FT-IR) spectroscopy was established many years ago, the full potential of infrared spectroscopy has not been properly recognized, and its intrinsic potential is still put aside. FT-IR has outstandingly useful  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Hasegawa, Takeshi.
Quantitative infrared spectroscopy for understanding of a condensed matter.
Tokyo, Japan : Springer, 2017
(OCoLC)961408616
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Takeshi Hasegawa
ISBN: 9784431564935 4431564934
OCLC Number: 984692365
Description: 1 online resource (xi, 200 pages) : illustrations (some color)
Contents: Preface; Contents; 1 Infrared Spectroscopy as a Vibrational Spectroscopy; 1.1 Molecular Vibrations; 1.2 Normal Coordinate and Normal Modes; 1.3 Light Absorption by a Molecule: 1. Understanding by a Quantum Mechanical Approach; 1.4 Selection Rule of IR Spectroscopy; 1.5 Another Selection Rule on the Group Theory; 1.6 Light Absorption by a Molecule: 2. Understanding on Electrodynamics for a Bulk Matter Toward Beer's Law; References; 2 Fundamentals of FT-IR; 2.1 Principle of Spectral Measurements; 2.2 Introducing an Interferometer: FT-IR; 2.3 Laser and FT Spectrometer; 2.4 Apodization Function. Reference3 Surface Spectroscopy Using FT-IR; 3.1 Fundamentals of Ordinate Scale of FT-IR Spectra; 3.2 Absorbance Spectra of a Weakly Absorbing Matter; 3.3 Boundary Conditions in Electrodynamics; 3.4 A Model-Based Approach to Generate the TO Energy Loss Function; 3.5 Fresnel Equation and Optical Anisotropy; 3.6 Transfer Matrix Method; 3.7 Calculation of Single-Beam Spectra of the Background and the Sample Measurements; 3.8 TO and LO Energy Loss Functions: Introduction of the Thin-Film Approximation; 3.9 Analytical Expression of a Transmission Spectrum. 3.10 Preparation for the Analytical Expression of a Reflection Spectrum3.11 Analytical Expression of an RA Spectrum; 3.12 Analytical Expression of an ER Spectrum; 3.13 Analytical Expression of an Attenuated Total Reflection (ATR) Spectrum; 3.14 Specular Reflection Spectrum; 3.15 Surface Selection Rules of IR Surface Spectroscopy; 3.16 Sampling Techniques; References; 4 IR Absorption of a Dielectric Matter: Phase Retardation of the Polarization Density; 4.1 Dielectric Matter and Electric Permittivity; 4.2 Electric Susceptibility and Linear Convolution. 4.3 Electric Susceptibility and Green's Function4.4 Complex Electric Permittivity; References; 5 Chemometrics for FTIR; 5.1 Beer's Law and a Single-Constituent System; 5.2 Extended Beer's Law for a Multi-Constituent System: CLS Regression; 5.3 Least Squares Solution of a Regression Equation; 5.4 Intrinsic Limitation of CLS Regression; 5.5 Inverse Beer's Law: ILS Regression (or MLR); 5.6 Principal Component Analysis (PCA); 5.7 Merge of ILS and PCA: PCR; 5.8 Independent Residual Terms: PLS; 5.9 Efficient Removal of Spectral Noise Using PCA. 5.10 Alternative Least Squares (ALS) for Spectral Decomposition5.11 Factor Analytical Resolution of Minute Signals (FARMS); References; 6 Applications: Various Techniques to Make the Best Use of IR Spectroscopy; 6.1 Specular Reflection and KK Analysis; 6.2 IR pMAIRS Technique: Quantitative Molecular Orientation Analysis in a Thin Film; 6.3 Fluorocarbon-Specific IR Spectroscopy; References; 7 Appendix; 7.1 Fundamental Parameters in Electrodynamics; 7.2 Continuity of Electric and Magnetic Fields at an Interface; 7.3 Factor Group Analysis of PTFE Having the 136 Helix Conformation; References.
Responsibility: Takeshi Hasegawa.

Abstract:

This book is intended to provide a course of infrared spectroscopy for quantitative analysis, covering both bulk matter and surface/interface analyses.  Read more...

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