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Radiation effects and soft errors in integrated circuits and electronic devices
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Radiation effects and soft errors in integrated circuits and electronic devices

Author: Ronald Donald Schrimpf; D M Fleetwood
Publisher: Singapore ; New Jersey : World Scientific Pub., ©2004.
Series: Selected topics in electronics and systems, vol. 34.
Edition/Format:   eBook : EnglishView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Radiation effects and soft errors in integrated circuits and electronic devices.
Singapore ; New Jersey : World Scientific Pub., c2004
(DLC) 2006273469
Material Type: Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Ronald Donald Schrimpf; D M Fleetwood
ISBN: 9789812794703 9812794700
OCLC Number: 646769029
Notes: Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
Description: 1 online resource (viii, 339 p.) : ill.
Series Title: Selected topics in electronics and systems, vol. 34.
Responsibility: editors, R.D. Schrimpf, D.M. Fleetwood.

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