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Author: IEEE Symposium on Computer Software Reliability.; Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Long Island Section.
Publisher: New York, Institute of Electrical and Electronics Engineers.
Edition/Format:   Journal, magazine : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Journal / Magazine / Newspaper
All Authors / Contributors: IEEE Symposium on Computer Software Reliability.; Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Long Island Section.
ISSN:0091-469X
OCLC Number: 1787096
Description: 28 cm.
Other Titles: Record - I.E.E.E. Symposium on Computer Software Reliability
Record - Institute of Electrical and Electronics Engineers Symposium on Computer Software Reliability

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