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Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Author: Rochit RajsumanYong-Khim SweeLee-Yee LauIEEE Computer Society. Test Technology Technical Committee.IEEE Computer Society. Technical Committee on VLSI.All authors
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Rochit Rajsuman; Yong-Khim Swee; Lee-Yee Lau; IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Solid-State Circuits Council.
ISBN: 0818674660 9780818674662
OCLC Number: 36038317
Notes: "IEEE catalog number 96TB100042"--Title page verso.
Description: ix, 123 pages : illustrations ; 28 cm
Other Titles: Memory Technology, Design and Testing, 1996, Records of the 1996 IEEE International Workshop on.
1996 IEEE International Workshop on Memory Technology, Design, and Testing
Responsibility: edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.

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