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Reflection high-energy electron diffraction

Author: Ayahiko Ichimiya; Philip I Cohen
Publisher: Cambridge, U.K. ; New York : Cambridge University Press, 2004.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:
"Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts. First the principles of electron diffraction and many exaples
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Ayahiko Ichimiya; Philip I Cohen
ISBN: 0521453739 9780521453738 9780521184021 0521184029
OCLC Number: 54529276
Description: xi, 353 pages : illustrations ; 26 cm
Contents: Historical survey --
Instrumentation --
Wave properties of electrons --
The diffraction conditions --
Geometrical features of the pattern --
Kikuchi and resonance patterns --
Real diffraction patterns --
Electron scattering by atoms --
Kinematic electron diffraction --
Fourier components of the crystal potential --
Dynamical theory : transfer matrix method --
Dynamical theory : embedded R-matrix method --
Dynamical theory : integral method --
Structural analysis of crystal surfaces --
Inelastic scattering in a crystal --
Weakly disordered surfaces --
Strongly disordered surfaces --
RHEED intensity oscillations.
Responsibility: Ayahiko Ichimiya and Philip I. Cohen.
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Abstract:

An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts.  Read more...

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Review of the hardback: 'For MBE [molecular beam epitaxy experts this book brings a concise and in depth description of the most salient features of modern MBE growth. For beginners it provides an Read more...

 
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