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Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

Author: Institute of Electrical and Electronics Engineers. Electron Devices Group.; IEEE Reliability Group.
Publisher: New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, ©1973.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Institute of Electrical and Electronics Engineers. Electron Devices Group.; IEEE Reliability Group.
OCLC Number: 1526333
Notes: "IEEE catalog no. 73 CHO 755-9 PHY."
Description: 318 pages : illustrations ; 28 cm
Responsibility: sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group.

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