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Reliability physics and engineering : time-to-failure modeling

Author: J W McPherson
Publisher: Cham ; New York : Springer, ©2013.
Edition/Format:   eBook : Document : English : 2nd edView all editions and formats
Summary:
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: · Materials/Device Degradation · Degradation Kinetics · Time-To-Failure Modeling · Statistical Tools · Failure-Rate Modeling · Accelerated Testing · Ramp-To-Failure Testing · Important Failure Mechanisms for Integrated Circuits · Important  Read more...
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Genre/Form: Electronic books
Ebook
Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: J W McPherson
ISBN: 9783319001227 3319001221 3319001213 9783319001210
OCLC Number: 847839598
Description: 1 online resource
Contents: Introduction --
Materials and Device Degradation --
From Material/Device Degradation to Time-to-Failure --
Time-to-Failure Modeling --
Gaussian Statistics: An Overview --
Time-to-Failure Statistics --
Failure Rate Modeling --
Accelerated Degradation --
Acceleration Factor Modeling --
Ramp-to-Failure Testing --
Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits --
Time-to-Failure Models for Selected Failure Mechanisms in Mechanical Engineering --
Conversion of Dynamical Stresses into Effective Static Values --
Increasing the Reliability of Device/Product Designs --
Screening --
Heat Generation and Dissipation --
Sampling Plans and Confidence Intervals.
Responsibility: J.W. McPherson.

Abstract:

This book provides critically important information for designing and building reliable cost-effective products. It includes numerous example problems with solutions.  Read more...

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Primary Entity

<http://www.worldcat.org/oclc/847839598> # Reliability physics and engineering : time-to-failure modeling
    a schema:MediaObject, schema:CreativeWork, schema:Book ;
    library:oclcnum "847839598" ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/sz> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/796529311#Place/cham> ; # Cham
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/quality_control_reliability_safety_and_risk> ; # Quality Control, Reliability, Safety and Risk.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Topic/ingenierie> ; # Ingénierie
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/mathematical_statistics> ; # Mathematical statistics.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/engineering> ; # Engineering.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/statistical_theory_and_methods> ; # Statistical Theory and Methods.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/energy_general> ; # Energy, general.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/system_safety> ; # System safety.
    schema:about <http://experiment.worldcat.org/entity/work/data/796529311#Thing/electronics_and_microelectronics_instrumentation> ; # Electronics and Microelectronics, Instrumentation.
    schema:about <http://id.worldcat.org/fast/1093646> ; # Reliability (Engineering)
    schema:about <http://dewey.info/class/620.00452/e23/> ;
    schema:bookEdition "2nd ed." ;
    schema:bookFormat schema:EBook ;
    schema:copyrightYear "2013" ;
    schema:creator <http://viaf.org/viaf/136309104> ; # Joe W. McPherson
    schema:datePublished "2013" ;
    schema:description "Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: · Materials/Device Degradation · Degradation Kinetics · Time-To-Failure Modeling · Statistical Tools · Failure-Rate Modeling · Accelerated Testing · Ramp-To-Failure Testing · Important Failure Mechanisms for Integrated Circuits · Important Failure Mechanisms for Mechanical Components · Conversion of Dynamic Stresses into Static Equivalents · Small Design Changes Producing Major Reliability Improvements · Screening Methods · Heat Generation and Dissipation · Sampling Plans and Confidence Intervals This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter. Reliability Physics and Engineeringcan bea very useful resource for students, engineers, and materials scientists."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/796529311> ;
    schema:genre "Ebook"@en ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://worldcat.org/entity/work/data/796529311#CreativeWork/> ;
    schema:name "Reliability physics and engineering : time-to-failure modeling"@en ;
    schema:productID "847839598" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/847839598#PublicationEvent/cham_new_york_springer_2013> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/796529311#Agent/springer> ; # Springer
    schema:url <https://login.proxy.lib.strath.ac.uk/login?url=http://link.springer.com/10.1007/978-3-319-00122-7> ;
    schema:url <http://proxy.library.carleton.ca/login?url=http://books.scholarsportal.info/viewdoc.html?id=/ebooks/ebooks3/springer/2013-08-13/4/9783319001227> ;
    schema:url <http://proxy.library.carleton.ca/login?url=http://dx.doi.org/10.1007/978-3-319-00122-7> ;
    schema:url <http://ebookcentral.proquest.com/lib/ucm/detail.action?docID=3095772> ;
    schema:url <https://grinnell.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-00122-7> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=3095772> ;
    schema:url <http://dx.doi.org/10.1007/978-3-319-00122-7> ;
    schema:url <http://link.springer.com/openurl?genre=book&isbn=978-3-319-00121-0> ;
    schema:workExample <http://worldcat.org/isbn/9783319001210> ;
    schema:workExample <http://worldcat.org/isbn/9783319001227> ;
    schema:workExample <http://dx.doi.org/10.1007/978-3-319-00122-7> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/847839598> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/electronics_and_microelectronics_instrumentation> # Electronics and Microelectronics, Instrumentation.
    a schema:Thing ;
    schema:name "Electronics and Microelectronics, Instrumentation." ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/energy_general> # Energy, general.
    a schema:Thing ;
    schema:name "Energy, general." ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/mathematical_statistics> # Mathematical statistics.
    a schema:Thing ;
    schema:name "Mathematical statistics." ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/quality_control_reliability_safety_and_risk> # Quality Control, Reliability, Safety and Risk.
    a schema:Thing ;
    schema:name "Quality Control, Reliability, Safety and Risk." ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/statistical_theory_and_methods> # Statistical Theory and Methods.
    a schema:Thing ;
    schema:name "Statistical Theory and Methods." ;
    .

<http://experiment.worldcat.org/entity/work/data/796529311#Thing/system_safety> # System safety.
    a schema:Thing ;
    schema:name "System safety." ;
    .

<http://id.worldcat.org/fast/1093646> # Reliability (Engineering)
    a schema:Intangible ;
    schema:name "Reliability (Engineering)"@en ;
    .

<http://link.springer.com/openurl?genre=book&isbn=978-3-319-00121-0>
    rdfs:comment "Springer eBooks (Engineering 2013)" ;
    .

<http://viaf.org/viaf/136309104> # Joe W. McPherson
    a schema:Person ;
    schema:familyName "McPherson" ;
    schema:givenName "Joe W." ;
    schema:givenName "J. W." ;
    schema:name "Joe W. McPherson" ;
    .

<http://worldcat.org/entity/work/data/796529311#CreativeWork/>
    a schema:CreativeWork ;
    schema:description "Printed edition:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/847839598> ; # Reliability physics and engineering : time-to-failure modeling
    .

<http://worldcat.org/isbn/9783319001210>
    a schema:ProductModel ;
    schema:isbn "3319001213" ;
    schema:isbn "9783319001210" ;
    .

<http://worldcat.org/isbn/9783319001227>
    a schema:ProductModel ;
    schema:isbn "3319001221" ;
    schema:isbn "9783319001227" ;
    .


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