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Robust inference

Author: Moti Lal Tiku; W Y Tan; N Balakrishnan
Publisher: New York : M. Dekker, ©1986.
Series: Statistics, textbooks and monographs, v. 71.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Tiku, Moti Lal.
Robust inference.
New York : M. Dekker, ©1986
(OCoLC)622100555
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Moti Lal Tiku; W Y Tan; N Balakrishnan
ISBN: 0824775325 9780824775322
OCLC Number: 13700697
Description: ix, 321 pages ; 24 cm.
Contents: Robustness of Some Classical Tests --
Student's t test --
Asymptotic robustness of the t test --
Variance-ratio test for comparing several means --
Asymptotic robustness of the variance-ratio test --
Small-sample distributions of t and F under nonnormal distributions and robustness --
Small-sample null distribution of F and type I robustness --
Small-sample power of the t test and the F test --
Testing equality of two variances --
Laguerre polynomial expansion of nonnegative random variables --
Estimation Procedures for Censored Samples --
Type II censoring --
Truncated distributions and their cumulants --
Estimation of parameters from type II censored samples --
Least-squares estimators (BLUEs) --
Maximum likelihood estimators (MLEs) --
MMLEs for the normal --
Robust estimators and comparisons with the MMLEs --
Random choice of the proportion of censoring --
Adaptive estimators of location --
Order statistics --
MMLEs for Other Distributions --
MMLE for log-normal distribution --
MMLE for the logistic distribution --
Estimation of parameters of exponential distribution --
MML estimation of parameters for Rayleigh distribution --
MML estimation in progressively censored samples --
MML estimation for truncated distributions --
Robust Tests --
Robust Studentized one-sample tests --
Testing equality of two location parameters when scale parameters are equal --
Testing equality of location parameters of extreme skew distributions --
Comparison of two location parameters when the scale parameters are unequal --
Comparison of two variances.
Series Title: Statistics, textbooks and monographs, v. 71.
Responsibility: M.L. Tiku, W.Y. Tan, N. Balakrishnan.

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