skip to content
Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition Preview this item
ClosePreview this item
Checking...

Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition

Author: Lee N Vanden Heuvel; ABS Consulting.
Publisher: Brookfield, Conn. : Rothstein Associates Inc., ©2008.
Edition/Format:   eBook : Document : English : 3rd edView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Additional Physical Format: Print version:
Root cause analysis handbook.
(DLC) 2008928960
(OCoLC)244794651
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Lee N Vanden Heuvel; ABS Consulting.
ISBN: 9781931332729 193133272X
OCLC Number: 899045317
Notes: Title from title screen.
Includes link to CD content.
Description: 1 online resource
Contents: Section 1. Basics of incident investigation --
section 2. Initiating investigations --
section 3. Gathering and preserving data --
section 4. Analyzing data --
section 5. Identifying root causes --
section 6. Developing recommendations --
section 7. Completing the investigation --
section 8. Selecting incidents for analysis --
section 9. Data and results trending --
section 10. Program development --
section 11. Contents of the companion CD and downloadable resources.
Responsibility: by ABS Consulting ; Lee N. Vanden Heuvel [and others].

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/899045317> # Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition
    a schema:CreativeWork, schema:MediaObject, schema:Book ;
   library:oclcnum "899045317" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/ctu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1613654542#Place/brookfield_conn> ; # Brookfield, Conn.
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_management_science> ; # BUSINESS & ECONOMICS--Management Science
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_management> ; # BUSINESS & ECONOMICS--Management
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/industrial_accidents_investigation> ; # Industrial accidents--Investigation
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_organizational_behavior> ; # BUSINESS & ECONOMICS--Organizational Behavior
   schema:about <http://dewey.info/class/658.562/e22/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/quality_control> ; # Quality control
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_industrial_management> ; # BUSINESS & ECONOMICS--Industrial Management
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/quality_control_data_processing> ; # Quality control--Data processing
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/total_quality_management> ; # Total quality management
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/critical_incident_technique> ; # Critical incident technique
   schema:about <http://experiment.worldcat.org/entity/work/data/1613654542#Topic/problem_solving> ; # Problem solving
   schema:author <http://experiment.worldcat.org/entity/work/data/1613654542#Organization/abs_consulting> ; # ABS Consulting.
   schema:author <http://experiment.worldcat.org/entity/work/data/1613654542#Person/vanden_heuvel_lee_n> ; # Lee N. Vanden Heuvel
   schema:bookEdition "3rd ed." ;
   schema:bookFormat schema:EBook ;
   schema:copyrightYear "2008" ;
   schema:datePublished "2008" ;
   schema:description "Section 1. Basics of incident investigation -- section 2. Initiating investigations -- section 3. Gathering and preserving data -- section 4. Analyzing data -- section 5. Identifying root causes -- section 6. Developing recommendations -- section 7. Completing the investigation -- section 8. Selecting incidents for analysis -- section 9. Data and results trending -- section 10. Program development -- section 11. Contents of the companion CD and downloadable resources."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1613654542> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/244794651> ;
   schema:name "Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition"@en ;
   schema:productID "899045317" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/899045317#PublicationEvent/brookfield_conn_rothstein_associates_inc_2008> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1613654542#Agent/rothstein_associates_inc> ; # Rothstein Associates Inc.
   schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=672169> ;
   schema:url <http://ebookcentral.proquest.com/lib/columbia/detail.action?docID=3400321> ;
   schema:url <http://www.books24x7.com/marc.asp?bookid=27515> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=3400321> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=2147531> ;
   schema:url <http://site.ebrary.com/id/10817867> ;
   schema:url <http://public.ebookcentral.proquest.com/choice/publicfullrecord.aspx?p=3400321> ;
   schema:workExample <http://worldcat.org/isbn/9781931332729> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/899045317> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1613654542#Agent/rothstein_associates_inc> # Rothstein Associates Inc.
    a bgn:Agent ;
   schema:name "Rothstein Associates Inc." ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Person/vanden_heuvel_lee_n> # Lee N. Vanden Heuvel
    a schema:Person ;
   schema:familyName "Vanden Heuvel" ;
   schema:givenName "Lee N." ;
   schema:name "Lee N. Vanden Heuvel" ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Place/brookfield_conn> # Brookfield, Conn.
    a schema:Place ;
   schema:name "Brookfield, Conn." ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_industrial_management> # BUSINESS & ECONOMICS--Industrial Management
    a schema:Intangible ;
   schema:name "BUSINESS & ECONOMICS--Industrial Management"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_management> # BUSINESS & ECONOMICS--Management
    a schema:Intangible ;
   schema:name "BUSINESS & ECONOMICS--Management"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_management_science> # BUSINESS & ECONOMICS--Management Science
    a schema:Intangible ;
   schema:name "BUSINESS & ECONOMICS--Management Science"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/business_&_economics_organizational_behavior> # BUSINESS & ECONOMICS--Organizational Behavior
    a schema:Intangible ;
   schema:name "BUSINESS & ECONOMICS--Organizational Behavior"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/critical_incident_technique> # Critical incident technique
    a schema:Intangible ;
   schema:name "Critical incident technique"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/industrial_accidents_investigation> # Industrial accidents--Investigation
    a schema:Intangible ;
   schema:name "Industrial accidents--Investigation"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/quality_control_data_processing> # Quality control--Data processing
    a schema:Intangible ;
   schema:name "Quality control--Data processing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1613654542#Topic/total_quality_management> # Total quality management
    a schema:Intangible ;
   schema:name "Total quality management"@en ;
    .

<http://worldcat.org/isbn/9781931332729>
    a schema:ProductModel ;
   schema:isbn "193133272X" ;
   schema:isbn "9781931332729" ;
    .

<http://www.worldcat.org/oclc/244794651>
    a schema:CreativeWork ;
   rdfs:label "Root cause analysis handbook." ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/899045317> ; # Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition
    .

<http://www.worldcat.org/title/-/oclc/899045317>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/899045317> ; # Root cause analysis handbook : a guide to efficient and effective incident investigation, third edition
   schema:dateModified "2017-12-23" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.