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Sample preparation handbook for transmission electron microscopy : methodology

Author: Jeanne Ayache
Publisher: New York : Springer, ©2010.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and
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Genre/Form: Electronic books
Laboratory manuals
Additional Physical Format: Print version:
Sample preparation handbook for transmission electron microscopy.
New York : Springer, ©2010
(OCoLC)495781318
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jeanne Ayache
ISBN: 9780387981819 0387981810 9780387981826 0387981829
OCLC Number: 663096076
Description: 1 online resource (xxiii, 250 pages) : illustrations
Contents: Introduction to materials --
The different observation modes in electron microscopy (SEM, TEM, STEM) --
Materials problems and approaches for TEM and TEM/STEM analyses --
Physical and chemical mechanisms of preparation techniques --
Artifacts in transmission electron microscopy --
Selection of preparation techniques based on materials problems and TEM analyses --
Comparisons between techniques.-
Responsibility: Jeanne Ayache [and others] ; foreword by Ron Anderson.

Abstract:

This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two  Read more...

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