skip to content
Sample preparation handbook for transmission electron microscopy : techniques Preview this item
ClosePreview this item
Checking...

Sample preparation handbook for transmission electron microscopy : techniques

Author: Jeanne Ayache
Publisher: New York : Springer, ©2010.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:

This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Handbooks and manuals
Handbooks, manuals, etc
Document Type: Book
All Authors / Contributors: Jeanne Ayache
ISBN: 9781441959744 1441959742
OCLC Number: 495781754
Description: xxv, 338 pages : illustrations ; 24 cm
Contents: Part 1: Introduction --
Part 2: Preliminary preparation techniques --
Part 3: Thinning preparation techniques --
Part 4: Mechanical preparation techniques --
Part 5: Replica techniques --
Part 6: Techniques specific to fine particles --
Part 7: Contrast enhancement and labeling techniques.
Responsibility: Jeanne Ayache [and others] ; foreword by Ron Anderson.
More information:

Reviews

Editorial reviews

Publisher Synopsis

From the reviews: "This textbook is the combined result ... of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this Read more...

 
User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/495781754> # Sample preparation handbook for transmission electron microscopy : techniques
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "495781754" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   schema:about <http://experiment.worldcat.org/entity/work/data/2867193341#Topic/transmission_electron_microscopy_technique> ; # Transmission electron microscopy--Technique
   schema:about <http://id.worldcat.org/fast/1154861> ; # Transmission electron microscopy--Technique
   schema:about <http://dewey.info/class/620.11/> ;
   schema:about <http://id.worldcat.org/fast/1028396> ; # Mounting of microscope specimens
   schema:about <http://id.loc.gov/authorities/subjects/sh85087970> ; # Mounting of microscope specimens
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/49291698> ; # Jeanne Ayache
   schema:copyrightYear "2010" ;
   schema:datePublished "2010" ;
   schema:description "Part 1: Introduction -- Part 2: Preliminary preparation techniques -- Part 3: Thinning preparation techniques -- Part 4: Mechanical preparation techniques -- Part 5: Replica techniques -- Part 6: Techniques specific to fine particles -- Part 7: Contrast enhancement and labeling techniques."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/2867193341> ;
   schema:genre "Handbooks and manuals"@en ;
   schema:inLanguage "en" ;
   schema:name "Sample preparation handbook for transmission electron microscopy : techniques"@en ;
   schema:productID "495781754" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/495781754#PublicationEvent/new_york_springer_2010> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/2867193341#Agent/springer> ; # Springer
   schema:workExample <http://worldcat.org/isbn/9781441959744> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/495781754> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/2867193341#Topic/transmission_electron_microscopy_technique> # Transmission electron microscopy--Technique
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh93001918> ;
   schema:name "Transmission electron microscopy--Technique"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85087970> # Mounting of microscope specimens
    a schema:Intangible ;
   schema:name "Mounting of microscope specimens"@en ;
    .

<http://id.worldcat.org/fast/1028396> # Mounting of microscope specimens
    a schema:Intangible ;
   schema:name "Mounting of microscope specimens"@en ;
    .

<http://id.worldcat.org/fast/1154861> # Transmission electron microscopy--Technique
    a schema:Intangible ;
   schema:name "Transmission electron microscopy--Technique"@en ;
    .

<http://viaf.org/viaf/49291698> # Jeanne Ayache
    a schema:Person ;
   schema:birthDate "1951" ;
   schema:familyName "Ayache" ;
   schema:givenName "Jeanne" ;
   schema:name "Jeanne Ayache" ;
    .

<http://worldcat.org/isbn/9781441959744>
    a schema:ProductModel ;
   schema:isbn "1441959742" ;
   schema:isbn "9781441959744" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.