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Sample Preparation Handbook for Transmission Electron Microscopy. Preview this item
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Sample Preparation Handbook for Transmission Electron Microscopy.

Author: Ayache, Jeanne.
Publisher: Springer Verlag 2010.
Edition/Format:   Print book : EnglishView all editions and formats

This handbook is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two  Read more...


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Document Type: Book
All Authors / Contributors: Ayache, Jeanne.
ISBN: 9781441960870 1441960872
OCLC Number: 502034143
Description: pages
Contents: Volume 1: MethodologyIntroduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.- Volume 2: TechniquesIntroduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-


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