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Sample Preparation Handbook for Transmission Electron Microscopy.

Author: Ayache, Jeanne.
Publisher: Springer Verlag 2010.
Edition/Format:   Book : EnglishView all editions and formats
Database:WorldCat
Summary:

This handbook is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two  Read more...

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Details

Document Type: Book
All Authors / Contributors: Ayache, Jeanne.
ISBN: 9781441960870 1441960872
OCLC Number: 502034143
Description: pages
Contents: Volume 1: Methodology Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.- Volume 2: Techniques Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-
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