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|Additional Physical Format:||Print version:|
|Document Type:||Book, Computer File|
|All Authors / Contributors:||
Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Daniele Laub; Ebooks Corporation.
|Description:||1 online resource (265 pages)|
|Contents:||Foreword; Preface to the English Edition; About the Authors; Contents; Abbreviations; 1 Methodology: General Introduction; 2 Introduction to Materials; 3 The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM); 4 Materials Problems and Approaches for TEMand TEM/STEM Analyses; 5 Physical and Chemical Mechanisms of Preparation Techniques; 6 Artifacts in Transmission Electron Microscopy; 7 Selection of Preparation Techniques Based on Material Problems and TEM Analyses; 8 Comparisons of Techniques; 9 Conclusion: What Is a Good Sample?; Photo Credits; Index.|
This comprehensive guide to sample preparation for the transmission electron microscope is divided into two main sections. The first covers theoretical and practical aspects, including the best preparative technique taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artefacts brought about by mechanical, physical and chemical methods. Also included is a discussion of how to combine techniques for.
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