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Sample preparation handbook for transmission electron microscopy

Author: Jeanne Ayache; et al
Publisher: New York : Springer Science+Business Media, 2010.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:

This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two  Read more...

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Document Type: Book
All Authors / Contributors: Jeanne Ayache; et al
ISBN: 9780387981819 0387981810 9781441959744 1441959742 9781441959751 1441959750 9780387981826 0387981829
OCLC Number: 890681011
Notes: [1] Methodology.
[2] Techniques.
Description: 2 vols : Ill
Contents: Methodology: General Introduction.- to Materials.- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM).- Materials Problems and Approaches for TEM and TEM/STEM Analyses.- Physical and Chemical Mechanisms of Preparation Techniques.- Artifacts in Transmission Electron Microscopy.- Selection of Preparation Techniques Based on Material Problems and TEM Analyses.- Comparisons of Techniques.- Conclusion: What Is a Good Sample?.
Responsibility: Jeanne Ayache ... [et al.].

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