skip to content
Scanning and transmission electron microscopy : an introduction Preview this item
ClosePreview this item
Checking...

Scanning and transmission electron microscopy : an introduction

Author: Stanley L Flegler; John William Heckman; Karen L Klomparens
Publisher: New York : Oxford University Press, [1995]
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

This textbook for courses on electron microscopy is intended for use in any laboratory. The book presents the practical and theoretical fundamentals of scanning and transmission electron microscopy  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Stanley L Flegler; John William Heckman; Karen L Klomparens
ISBN: 0195107519 9780195107517 0716770474 9780716770473
OCLC Number: 33166513
Notes: Originally published: New York : W.H. Freeman, ©1993.
Description: viii, 225 pages : illustrations ; 26 cm
Contents: 1. Introduction --
2. Electron sources and electron lenses --
Electron sources --
Electron lenses --
3. Vacuum systems --
Vacuum pumps commonly used in EM labs --
Methods of measuring vacuums --
Vacuum systems used in electron microscopy --
4. The transmission electron microscope --
Theory of operation --
Real images --
Virtual images --
Depth of field and depth of focus --
Anatomy of a transmission electron microscope --
Medium- and high-voltage transmission electron microscopy --
5. The scanning electron microscope --
Theory of operation --
Specimen-beam interactions --
Machine variables --
Ultrahigh-resolution SEMS --
Environmental SEMS --
Scanning transmission electron microscopes --
Scanning tunneling and atomic force microscopy --
6. Specimen preparation for TEM --
Negative staining of small particulates --
Ultrathin sectioning of larger samples --
Vacuum evaporators and evaporation techniques --
Shadowcasting and replica techniques --
Cytological techniques --
Preparation of nonbiological materials --
7. Specimen preparation for SEM --
Mounting --
Coating for conductivity --
Special methods for various sample types --
Biological sample preparation --
Alternative methods for biological samples --
SEM histochemistry for biological samples --
8. X-ray analysis --
X-ray production and naming --
Measuring the energy and wavelength of X rays --
Construction of the EDS detector --
Construction of the EDS X-ray analyzer --
Outputs --
Spectrum accumulation and interpretation --
Optimizing the detection of X rays --
Artifacts --
Quantitative analysis --
Sample preparation --
9. Electron micrographic techniques --
Silver graphic process --
Photographic printing --
Transmission electron micrography --
Scanning electron micrography --
The electronic darkroom --
Micrograph presentation and publication.
Responsibility: Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens.
More information:

Reviews

Editorial reviews

Publisher Synopsis

'the authors have been able to provide an authoritative impressive, and comprehensive spectrum of electron microscopy theory and practice in easily readable prose, accompanied by useful graphics ... Read more...

 
User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/33166513> # Scanning and transmission electron microscopy : an introduction
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "33166513" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   schema:about <http://experiment.worldcat.org/entity/work/data/348773#Topic/elektronenmikroskopie> ; # Elektronenmikroskopie
   schema:about <http://id.worldcat.org/fast/1154860> ; # Transmission electron microscopy
   schema:about <http://dewey.info/class/502.825/e20/> ;
   schema:about <http://id.worldcat.org/fast/1106480> ; # Scanning electron microscopy
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/69023824> ; # Karen L. Klomparens
   schema:contributor <http://viaf.org/viaf/64099737> ; # John William Heckman
   schema:creator <http://viaf.org/viaf/2565659> ; # Stanley L. Flegler
   schema:datePublished "1995" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/348773> ;
   schema:inLanguage "en" ;
   schema:name "Scanning and transmission electron microscopy : an introduction"@en ;
   schema:productID "33166513" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/33166513#PublicationEvent/new_york_oxford_university_press_1995> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/348773#Agent/oxford_university_press> ; # Oxford University Press
   schema:url <http://catdir.loc.gov/catdir/enhancements/fy0603/95039017-t.html> ;
   schema:workExample <http://worldcat.org/isbn/9780716770473> ;
   schema:workExample <http://worldcat.org/isbn/9780195107517> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/33166513> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/348773#Agent/oxford_university_press> # Oxford University Press
    a bgn:Agent ;
   schema:name "Oxford University Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/348773#Topic/elektronenmikroskopie> # Elektronenmikroskopie
    a schema:Intangible ;
   schema:name "Elektronenmikroskopie"@en ;
    .

<http://id.worldcat.org/fast/1106480> # Scanning electron microscopy
    a schema:Intangible ;
   schema:name "Scanning electron microscopy"@en ;
    .

<http://id.worldcat.org/fast/1154860> # Transmission electron microscopy
    a schema:Intangible ;
   schema:name "Transmission electron microscopy"@en ;
    .

<http://viaf.org/viaf/2565659> # Stanley L. Flegler
    a schema:Person ;
   schema:familyName "Flegler" ;
   schema:givenName "Stanley L." ;
   schema:name "Stanley L. Flegler" ;
    .

<http://viaf.org/viaf/64099737> # John William Heckman
    a schema:Person ;
   schema:familyName "Heckman" ;
   schema:givenName "John William" ;
   schema:name "John William Heckman" ;
    .

<http://viaf.org/viaf/69023824> # Karen L. Klomparens
    a schema:Person ;
   schema:familyName "Klomparens" ;
   schema:givenName "Karen L." ;
   schema:name "Karen L. Klomparens" ;
    .

<http://worldcat.org/isbn/9780195107517>
    a schema:ProductModel ;
   schema:isbn "0195107519" ;
   schema:isbn "9780195107517" ;
    .

<http://worldcat.org/isbn/9780716770473>
    a schema:ProductModel ;
   schema:isbn "0716770474" ;
   schema:isbn "9780716770473" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.