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Scanning electron microscope examination of wire bonds from high-reliability devices

Author: Kathryn O Leedy
Publisher: [Washington] : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1973.
Series: NBS technical note, 785.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Leedy, Kathryn O.
Scanning electron microscope examination of wire bonds from high-reliability devices.
[Washington] : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1973
(OCoLC)633064355
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Kathryn O Leedy
OCLC Number: 3352552
Description: vi, 28 pages : illustrations ; 26 cm.
Series Title: NBS technical note, 785.
Responsibility: Kathryn O. Leedy.

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