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Scanning electron microscopy and x-ray microanalysis

Author: Graham Lawes; A M James; ACOL (Project)
Publisher: Chichester [West Sussex] ; New York : Published on behalf of ACOL, Thames Polytecnic, London, by Wiley, ©1987.
Series: Analytical Chemistry by Open Learning (Series)
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis.

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Document Type: Book
All Authors / Contributors: Graham Lawes; A M James; ACOL (Project)
ISBN: 0471913901 9780471913900 047191391X 9780471913917
OCLC Number: 15549734
Description: xvii, 103 pages, [1] leaf of plates : illustrations (some color) ; 23 cm.
Contents: SEM-Instrumentation: Introduction; Principles of Operation; Specimen/Electron Interactions; Detectors; Operating Conditions and Limitations; Specimen Preparation: Specimen Characteristics; Drying Techniques; Coating; Cryo-SEM; SEM X-Ray Microanalysis-Instrumentation: Introduction; X-Ray Production in the SEM; Wavelength Dispersive Systems (WDS); Energy Dispersive Systems (EDX); Operating Conditions and Limitations; Data Handling; Other Surface Analytical Techniques.
Series Title: Analytical Chemistry by Open Learning (Series)
Responsibility: author, Grahame Lawes ; editor, Arthur M. James on behalf of ACOL.

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