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Scanning probe microscopy : analytical methods

Auteur: R Wiesendanger
Uitgever: Berlin ; New York : Springer-Verlag, ©1998.
Serie: Nanoscience and technology.
Editie/Formaat:   Print book : EngelsAlle edities en materiaalsoorten bekijken.
Database:WorldCat
Samenvatting:

This text provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of application of the chemical  Meer lezen...

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Details

Genre: Internetbron
Soort document: Boek, Internetbron
Alle auteurs / medewerkers: R Wiesendanger
ISBN: 3540638156 9783540638155
OCLC-nummer: 38048402
Beschrijving: xi, 216 pages : illustrations (some color) ; 25 cm.
Inhoud: Chemical information from scanning probe microscopy and spectroscopy / T.A. Jung [and others] --
Thermovoltages in scanning tunneling microscopy / R. Möller --
Spin-polarized scanning tunneling microscopy / R. Wiesendanger --
Photo emission from the scanning tunneling microscope / R. Berndt --
Laser scanning tunneling microscope / M. Völcker --
Scanning near-field optical microscopy / C. Fischer.
Serietitel: Nanoscience and technology.
Verantwoordelijkheid: Roland Wiesendanger (ed.).
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Primary Entity

<http://www.worldcat.org/oclc/38048402> # Scanning probe microscopy : analytical methods
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "38048402" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/795114400#Place/berlin> ; # Berlin
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://experiment.worldcat.org/entity/work/data/795114400#Topic/microscopie_a_sonde_a_balayage> ; # Microscopie à sonde à balayage
    schema:about <http://experiment.worldcat.org/entity/work/data/795114400#Topic/oppervlakken> ; # Oppervlakken
    schema:about <http://experiment.worldcat.org/entity/work/data/795114400#Topic/rastersondenmikroskopie> ; # Rastersondenmikroskopie
    schema:about <http://experiment.worldcat.org/entity/work/data/795114400#Topic/scanning_tunneling_microscopy> ; # Scanning tunneling microscopy
    schema:about <http://dewey.info/class/502.82/e21/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/795114400#Topic/materiaalonderzoek> ; # Materiaalonderzoek
    schema:about <http://id.worldcat.org/fast/1106485> ; # Scanning probe microscopy
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/112515169> ; # Roland Wiesendanger
    schema:copyrightYear "1998" ;
    schema:datePublished "1998" ;
    schema:description "Chemical information from scanning probe microscopy and spectroscopy / T.A. Jung [and others] -- Thermovoltages in scanning tunneling microscopy / R. Möller -- Spin-polarized scanning tunneling microscopy / R. Wiesendanger -- Photo emission from the scanning tunneling microscope / R. Berndt -- Laser scanning tunneling microscope / M. Völcker -- Scanning near-field optical microscopy / C. Fischer."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/795114400> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/795114400#Series/nanoscience_and_technology> ; # Nanoscience and technology.
    schema:name "Scanning probe microscopy : analytical methods"@en ;
    schema:productID "38048402" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/38048402#PublicationEvent/berlin_new_york_springer_verlag_1998> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/795114400#Agent/springer_verlag> ; # Springer-Verlag
    schema:url <http://catdir.loc.gov/catdir/enhancements/fy0815/97048773-t.html> ;
    schema:workExample <http://worldcat.org/isbn/9783540638155> ;
    umbel:isLike <http://d-nb.info/95217393X> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9874068> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/38048402> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Agent/springer_verlag> # Springer-Verlag
    a bgn:Agent ;
    schema:name "Springer-Verlag" ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Series/nanoscience_and_technology> # Nanoscience and technology.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/38048402> ; # Scanning probe microscopy : analytical methods
    schema:name "Nanoscience and technology." ;
    schema:name "Nanoscience and technology" ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Topic/materiaalonderzoek> # Materiaalonderzoek
    a schema:Intangible ;
    schema:name "Materiaalonderzoek"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Topic/microscopie_a_sonde_a_balayage> # Microscopie à sonde à balayage
    a schema:Intangible ;
    schema:name "Microscopie à sonde à balayage"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Topic/rastersondenmikroskopie> # Rastersondenmikroskopie
    a schema:Intangible ;
    schema:name "Rastersondenmikroskopie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/795114400#Topic/scanning_tunneling_microscopy> # Scanning tunneling microscopy
    a schema:Intangible ;
    schema:name "Scanning tunneling microscopy"@en ;
    .

<http://id.worldcat.org/fast/1106485> # Scanning probe microscopy
    a schema:Intangible ;
    schema:name "Scanning probe microscopy"@en ;
    .

<http://viaf.org/viaf/112515169> # Roland Wiesendanger
    a schema:Person ;
    schema:birthDate "1961" ;
    schema:familyName "Wiesendanger" ;
    schema:givenName "Roland" ;
    schema:givenName "R." ;
    schema:name "Roland Wiesendanger" ;
    .

<http://worldcat.org/isbn/9783540638155>
    a schema:ProductModel ;
    schema:isbn "3540638156" ;
    schema:isbn "9783540638155" ;
    .


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