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Scanning probe microscopy : analytical methods

著者: R Wiesendanger
出版商: Berlin ; New York : Springer-Verlag, ©1998.
丛书: Nanoscience and technology.
版本/格式:   图书 : 英语查看所有的版本和格式
数据库:WorldCat
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This text provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of application of the chemical  再读一些...

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材料类型: 互联网资源
文件类型: 书, 互联网资源
所有的著者/提供者: R Wiesendanger
ISBN: 3540638156 9783540638155
OCLC号码: 38048402
描述: xi, 216 pages : illustrations (some color) ; 25 cm.
内容: Chemical information from scanning probe microscopy and spectroscopy / T.A. Jung [and others] --
Thermovoltages in scanning tunneling microscopy / R. Möller --
Spin-polarized scanning tunneling microscopy / R. Wiesendanger --
Photo emission from the scanning tunneling microscope / R. Berndt --
Laser scanning tunneling microscope / M. Völcker --
Scanning near-field optical microscopy / C. Fischer.
丛书名: Nanoscience and technology.
责任: Roland Wiesendanger (ed.).
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<http://www.worldcat.org/oclc/38048402>
library:oclcnum"38048402"
library:placeOfPublication
library:placeOfPublication
library:placeOfPublication
rdf:typeschema:Book
rdf:typeschema:MediaObject
schema:about
schema:about
schema:about
schema:about
schema:about
schema:about
schema:about
schema:contributor
schema:copyrightYear"1998"
schema:datePublished"1998"
schema:description"Chemical information from scanning probe microscopy and spectroscopy / T.A. Jung [and others] -- Thermovoltages in scanning tunneling microscopy / R. Möller -- Spin-polarized scanning tunneling microscopy / R. Wiesendanger -- Photo emission from the scanning tunneling microscope / R. Berndt -- Laser scanning tunneling microscope / M. Völcker -- Scanning near-field optical microscopy / C. Fischer."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/795114400>
schema:inLanguage"en"
schema:isPartOf
schema:name"Scanning probe microscopy : analytical methods"@en
schema:publication
schema:publisher
schema:workExample
umbel:isLike<http://d-nb.info/95217393X>
wdrs:describedby

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