skip to content
Scanning probe microscopy of soft matter : fundamentals and practices. Preview this item
ClosePreview this item
Checking...

Scanning probe microscopy of soft matter : fundamentals and practices.

Author: V V T︠S︡ukruk; Srikanth Singamaneni
Publisher: Weinheim : Wiley, 2011.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Additional Physical Format: Print version:
Tsukruk, Vladimir V.
Scanning Probe Microscopy of Soft Matter : Fundamentals and Practices.
Weinheim : Wiley, ©2012
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: V V T︠S︡ukruk; Srikanth Singamaneni
ISBN: 9783527639953 3527639950 9783527639977 3527639977 9781283869812 1283869810 9783527639960 3527639969 9783527639984 3527639985
OCLC Number: 797919432
Notes: 5.6 Unfolding of Macromolecules.
Description: 1 online resource (xix, 664 pages) : illustrations
Contents: Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices; Contents; Preface; Part One: Microscopy Fundamentals; 1 Introduction; References; 2 Scanning Probe Microscopy Basics; 2.1 Basic Principles of Scanning Probe Microscopy; 2.2 Scanning Tunneling Microscopy; 2.3 Advent of Atomic Force Microscopy; 2.4 Overview of Instrumentation; 2.4.1 Scanners; 2.4.2 Microcantilevers as Force Sensors; 2.4.3 Electronic Feedback; 2.5 Probes and Cantilevers in Scanning Probe Microscopy; 2.5.1 Physical Attributes of Microcantilevers; 2.5.2 Tip Characterization; 2.5.3 Tip Modification. 2.6 Modes of Operation2.6.1 Contact Mode; 2.6.2 Noncontact Mode and Tapping Mode; 2.7 Advantages and Limitations; References; 3 Basics of Atomic Force Microscopy Studies of Soft Matter; 3.1 Physical Principles: Forces of Interaction; 3.1.1 Long-Range Forces; 3.1.2 Short-Range Forces; 3.1.3 Other Forces of Interaction; 3.1.4 Resolution Criteria; 3.1.5 Scan Rates and Resonances; 3.2 Imaging in Controlled Environment; 3.2.1 AFM Imaging in Liquid; 3.2.2 AFM at Controlled Temperature; 3.2.3 Imaging in Controlled Humidity; 3.3 Artifacts in AFM Imaging of Soft Materials. 3.3.1 Surface Damage and Deformation3.3.2 Tip Dilation; 3.3.3 Damaged and Contaminated Tip or Surface; 3.3.4 Noises and Vibrations; 3.3.5 Tip Artifacts; 3.3.6 Thermal Drift and Piezoelement Creep; 3.3.7 Oscillations and Artificial Periodicities; 3.3.8 Image Processing Artifacts; 3.4 Some Suggestions and Hints for Avoiding Artifacts; 3.4.1 Tip Testing and Deconvolution; 3.4.2 Force Control; 3.4.3 Tip Contamination and Cleaning; References; 4 Advanced Imaging Modes; 4.1 Surface Force Spectroscopy; 4.1.1 Introduction to Force Spectroscopy; 4.1.2 Force-Distance Curves; 4.1.3 Force Mapping Mode. 4.2 Friction Force Microscopy4.3 Shear Modulation Force Microscopy; 4.4 Chemical Force Microscopy (CFM); 4.5 Pulsed Force Microscopy; 4.6 Colloidal Probe Microscopy; 4.7 Scanning Thermal Microscopy; 4.7.1 Thermal Resistive Probes and Spatial Resolution; 4.7.2 Localized Thermal Analysis; 4.7.3 Thermal Conductivity; 4.8 Kelvin Probe and Electrostatic Force Microscopy; 4.9 Conductive Force Microscopy; 4.10 Magnetic Force Microscopy; 4.11 Scanning Acoustic Force Microscopy; 4.11.1 Force Modulation; 4.11.2 Ultrasonic Force Microscopy; 4.12 High-Speed Scanning Probe Microscopy; References. Part Two: Probing Nanoscale Physical and Chemical Properties5 Mechanical Properties of Polymers and Macromolecules; 5.1 Elements of Contact Mechanics and Elastic Modulus; 5.1.1 General SFS Nanoprobing Principles; 5.1.2 Substrate Effects; 5.1.3 Issues and Key Assumptions with Nanomechanical Probing; 5.2 Probing of Elastic Moduli for Different Materials: Selected Examples; 5.2.1 Bulk Materials and Blends; 5.2.2 Ultrathin Polymer Films from Different Polymers; 5.2.3 Probing Individual Macromolecules; 5.3 Adhesion Measurements; 5.4 Viscoelasticity Measurements; 5.5 Friction.
More information:

Abstract:

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical  Read more...

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/797919432> # Scanning probe microscopy of soft matter : fundamentals and practices.
    a schema:CreativeWork, schema:Book, schema:MediaObject ;
    library:oclcnum "797919432" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    schema:about <http://dewey.info/class/502.825/> ;
    schema:about <http://id.worldcat.org/fast/1011957> ; # Materials science
    schema:about <http://experiment.worldcat.org/entity/work/data/1073495666#Topic/soft_condensed_matter> ; # Soft condensed matter
    schema:about <http://id.worldcat.org/fast/1106485> ; # Scanning probe microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/1073495666#Topic/science_electron_microscopes_&_microscopy> ; # SCIENCE--Electron Microscopes & Microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/1073495666#Topic/electron_microscopy_computer_simulation> ; # Electron microscopy--Computer simulation
    schema:author <http://viaf.org/viaf/34714276> ; # Vladimir Vasilʹevich T︠S︡ukruk
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/220141906> ; # Srikanth Singamaneni
    schema:datePublished "2011" ;
    schema:description "Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:>"@en ;
    schema:description "Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices; Contents; Preface; Part One: Microscopy Fundamentals; 1 Introduction; References; 2 Scanning Probe Microscopy Basics; 2.1 Basic Principles of Scanning Probe Microscopy; 2.2 Scanning Tunneling Microscopy; 2.3 Advent of Atomic Force Microscopy; 2.4 Overview of Instrumentation; 2.4.1 Scanners; 2.4.2 Microcantilevers as Force Sensors; 2.4.3 Electronic Feedback; 2.5 Probes and Cantilevers in Scanning Probe Microscopy; 2.5.1 Physical Attributes of Microcantilevers; 2.5.2 Tip Characterization; 2.5.3 Tip Modification."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1073495666> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://worldcat.org/entity/work/data/1073495666#CreativeWork/scanning_probe_microscopy_of_soft_matter_fundamentals_and_practices> ;
    schema:name "Scanning probe microscopy of soft matter : fundamentals and practices."@en ;
    schema:productID "797919432" ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=510215> ;
    schema:url <http://dx.doi.org/10.1002/9783527639953> ;
    schema:url <http://onlinelibrary.wiley.com/book/10.1002/9783527639953> ;
    schema:url <http://site.ebrary.com/id/10577523> ;
    schema:url <http://www.myilibrary.com?id=418231> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=843676> ;
    schema:workExample <http://worldcat.org/isbn/9783527639960> ;
    schema:workExample <http://worldcat.org/isbn/9781283869812> ;
    schema:workExample <http://worldcat.org/isbn/9783527639977> ;
    schema:workExample <http://worldcat.org/isbn/9783527639953> ;
    schema:workExample <http://worldcat.org/isbn/9783527639984> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/797919432> ;
    .


Related Entities

<http://dx.doi.org/10.1002/9783527639953>
    rdfs:comment "An electronic book accessible through the World Wide Web; click for information" ;
    .

<http://experiment.worldcat.org/entity/work/data/1073495666#Topic/electron_microscopy_computer_simulation> # Electron microscopy--Computer simulation
    a schema:Intangible ;
    schema:name "Electron microscopy--Computer simulation"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1073495666#Topic/science_electron_microscopes_&_microscopy> # SCIENCE--Electron Microscopes & Microscopy
    a schema:Intangible ;
    schema:name "SCIENCE--Electron Microscopes & Microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1073495666#Topic/soft_condensed_matter> # Soft condensed matter
    a schema:Intangible ;
    schema:name "Soft condensed matter"@en ;
    .

<http://id.worldcat.org/fast/1011957> # Materials science
    a schema:Intangible ;
    schema:name "Materials science"@en ;
    .

<http://id.worldcat.org/fast/1106485> # Scanning probe microscopy
    a schema:Intangible ;
    schema:name "Scanning probe microscopy"@en ;
    .

<http://viaf.org/viaf/220141906> # Srikanth Singamaneni
    a schema:Person ;
    schema:familyName "Singamaneni" ;
    schema:givenName "Srikanth" ;
    schema:name "Srikanth Singamaneni" ;
    .

<http://viaf.org/viaf/34714276> # Vladimir Vasilʹevich T︠S︡ukruk
    a schema:Person ;
    schema:familyName "T︠S︡ukruk" ;
    schema:givenName "Vladimir Vasilʹevich" ;
    schema:givenName "V. V." ;
    schema:name "Vladimir Vasilʹevich T︠S︡ukruk" ;
    .

<http://worldcat.org/entity/work/data/1073495666#CreativeWork/scanning_probe_microscopy_of_soft_matter_fundamentals_and_practices>
    a schema:CreativeWork ;
    rdfs:label "Scanning Probe Microscopy of Soft Matter : Fundamentals and Practices." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/797919432> ; # Scanning probe microscopy of soft matter : fundamentals and practices.
    .

<http://worldcat.org/isbn/9781283869812>
    a schema:ProductModel ;
    schema:isbn "1283869810" ;
    schema:isbn "9781283869812" ;
    .

<http://worldcat.org/isbn/9783527639953>
    a schema:ProductModel ;
    schema:isbn "3527639950" ;
    schema:isbn "9783527639953" ;
    .

<http://worldcat.org/isbn/9783527639960>
    a schema:ProductModel ;
    schema:isbn "3527639969" ;
    schema:isbn "9783527639960" ;
    .

<http://worldcat.org/isbn/9783527639977>
    a schema:ProductModel ;
    schema:isbn "3527639977" ;
    schema:isbn "9783527639977" ;
    .

<http://worldcat.org/isbn/9783527639984>
    a schema:ProductModel ;
    schema:isbn "3527639985" ;
    schema:isbn "9783527639984" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.