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Secondary ion mass spectrometry : SIMS VII : proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989

Author: A Benninghoven
Publisher: Chichester ; New York : Wiley, ©1990.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Additional Physical Format: Online version:
International Conference on Secondary Ion Mass Spectrometry (7th : 1989 : Monterey, Calif.).
Secondary ion mass spectrometry.
Chichester ; New York : Wiley, ©1990
(OCoLC)645884356
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: A Benninghoven
ISBN: 0471927384 9780471927389
OCLC Number: 21228320
Description: xxvii, 963 pages : illustrations ; 24 cm
Responsibility: editors A. Benninghoven [and others].

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