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Sehen heißt wissen : das Rasterelektronenmikroskop im Fehleranalyselabor

Author: Richard Eckert
Publisher: Stuttgart : Kurz, 1998.
Edition/Format:   Print book : German : 1. AuflView all editions and formats
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Genre/Form: Bildband
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Richard Eckert
ISBN: 3893010815 9783893010813
OCLC Number: 174723737
Description: 182 Seiten : überwiegend Illustrationen, Diagramme
Responsibility: Richard Eckert.

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