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Selected papers on speckle metrology

Author: R S Sirohi; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE Optical Engineering Press, ©1991.
Series: SPIE milestone series, v. MS 35.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Selected papers on speckle metrology.
Bellingham, Wash., USA : SPIE Optical Engineering Press, ©1991
(OCoLC)692312887
Document Type: Book
All Authors / Contributors: R S Sirohi; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819406384 9780819406385 0819406392 9780819406392
OCLC Number: 23731527
Notes: "A publication of SPIE--the International Society for Optical Engineering."
Description: xviii, 668 pages : illustrations ; 28 cm.
Series Title: SPIE milestone series, v. MS 35.
Other Titles: Speckle metrology.
Responsibility: Rajpal S. Sirohi, editor.

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