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Selected reprints on logic design for testability

Author: Constantin C Timoc
Publisher: Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, ©1984.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Selected reprints on logic design for testability.
Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, ©1984
(OCoLC)568037970
Document Type: Book
All Authors / Contributors: Constantin C Timoc
ISBN: 0818605731 9780818605734 0818645733 9780818645730
OCLC Number: 11175793
Notes: "IEEE catalog number EH0215-4."
"IEEE Computer Society order number 573."
Description: viii, 315 pages : illustrations ; 28 cm
Responsibility: compiled by Constantin C. Timoc.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/11175793> # Selected reprints on logic design for testability
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "11175793" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/54667393#Place/los_angeles_ca> ; # Los Angeles, CA
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mdu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/54667393#Place/silver_spring_md> ; # Silver Spring, MD
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/logic_circuits_testing> ; # Logic circuits--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/logische_schaltung> ; # Logische Schaltung
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/circuits_logiques_essais> ; # Circuits logiques--Essais
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/aufsatzsammlung> ; # Aufsatzsammlung
   schema:about <http://dewey.info/class/621.381958350287/e19/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/test> ; # Test
   schema:about <http://id.worldcat.org/fast/1002044> ; # Logic circuits--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/54667393#Topic/entwurf> ; # Entwurf
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/272421510> ; # Constantin C. Timoc
   schema:copyrightYear "1984" ;
   schema:datePublished "1984" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/54667393> ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/568037970> ;
   schema:name "Selected reprints on logic design for testability"@en ;
   schema:productID "11175793" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/11175793#PublicationEvent/silver_spring_md_ieee_computer_society_press_los_angeles_ca_order_from_ieee_computer_society_1984> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/54667393#Agent/ieee_computer_society_press> ; # IEEE Computer Society Press
   schema:publisher <http://experiment.worldcat.org/entity/work/data/54667393#Agent/order_from_ieee_computer_society> ; # Order from IEEE Computer Society
   schema:workExample <http://worldcat.org/isbn/9780818645730> ;
   schema:workExample <http://worldcat.org/isbn/9780818605734> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/11175793> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/54667393#Agent/ieee_computer_society_press> # IEEE Computer Society Press
    a bgn:Agent ;
   schema:name "IEEE Computer Society Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/54667393#Agent/order_from_ieee_computer_society> # Order from IEEE Computer Society
    a bgn:Agent ;
   schema:name "Order from IEEE Computer Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/54667393#Place/los_angeles_ca> # Los Angeles, CA
    a schema:Place ;
   schema:name "Los Angeles, CA" ;
    .

<http://experiment.worldcat.org/entity/work/data/54667393#Place/silver_spring_md> # Silver Spring, MD
    a schema:Place ;
   schema:name "Silver Spring, MD" ;
    .

<http://experiment.worldcat.org/entity/work/data/54667393#Topic/circuits_logiques_essais> # Circuits logiques--Essais
    a schema:Intangible ;
   schema:name "Circuits logiques--Essais"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/54667393#Topic/logische_schaltung> # Logische Schaltung
    a schema:Intangible ;
   schema:name "Logische Schaltung"@en ;
    .

<http://id.worldcat.org/fast/1002044> # Logic circuits--Testing
    a schema:Intangible ;
   schema:name "Logic circuits--Testing"@en ;
    .

<http://viaf.org/viaf/272421510> # Constantin C. Timoc
    a schema:Person ;
   schema:familyName "Timoc" ;
   schema:givenName "Constantin C." ;
   schema:name "Constantin C. Timoc" ;
    .

<http://worldcat.org/isbn/9780818605734>
    a schema:ProductModel ;
   schema:isbn "0818605731" ;
   schema:isbn "9780818605734" ;
    .

<http://worldcat.org/isbn/9780818645730>
    a schema:ProductModel ;
   schema:isbn "0818645733" ;
   schema:isbn "9780818645730" ;
    .

<http://www.worldcat.org/oclc/568037970>
    a schema:CreativeWork ;
   rdfs:label "Selected reprints on logic design for testability." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/11175793> ; # Selected reprints on logic design for testability
    .


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